Fatigue characteristics of Pb(Zr0.3Ti0.7)O 3 thin films prepared by metalorganic decomposition

Feng Yan, Peng Bao, Yening Wang

Research output: Journal article publicationJournal articleAcademic researchpeer-review


The fatigue properties of PZT thin films with Pt electrodes are strongly influenced by the grain size. A film with smaller grains has better fatigue properties. We assume that the fatigue is mainly due to the pinning of domain walls in PZT grains by space charges or charged point defects near the Pt electrodes. The point defects always accumulate near the PZT/Pt interface because the internal electric field is very strong near the interface. Therefore the film with a lower fraction of grains touching the Pt electrodes has better fatigue properties. The permittivity of the thin film decreases with decreasing grain size. This may arise from a decrease in the mobility of the domain walls.
Original languageEnglish
Pages (from-to)33-38
Number of pages6
Issue number1
Publication statusPublished - 1 Dec 2001
Externally publishedYes


  • dielectric
  • fatigue
  • ferroelectric thin film

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics


Dive into the research topics of 'Fatigue characteristics of Pb(Zr0.3Ti0.7)O 3 thin films prepared by metalorganic decomposition'. Together they form a unique fingerprint.

Cite this