Far field resolution beyond the Abbe limit using photodiffraction

T. S. Velinov, C. W. See, Michael Geoffrey Somekh, K. L. Schumacher

Research output: Journal article publicationJournal articleAcademic researchpeer-review

1 Citation (Scopus)

Abstract

In this paper we show how a tightly focused pump beam can be used to alter the local refractive index of the sample. This local variation acts as a scattering site, which enables resolution exceeding that of a conventional scanning microscope to be obtained in the far field. The improvement in resolution depends on a number of factors which are discussed in the paper, including the optical configuration (confocal or non-confocal), the thermal properties of the sample, the 'strength' of the object and the duration of the heating pulse. Experimental results confirming the theoretical predictions are presented; these demonstrate more than 25% improvement in edge response compared with a conventional scanning system.
Original languageEnglish
Pages (from-to)142-149
Number of pages8
JournalJournal of Microscopy
Volume193
Issue number2
DOIs
Publication statusPublished - 1 Jan 1999
Externally publishedYes

Keywords

  • Abbe criterion
  • Confocal microscopy
  • Diffraction
  • Photothermal
  • Scanning optical microscopy
  • Superresolution

ASJC Scopus subject areas

  • Instrumentation

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