Far field resolution beyond the Abbe limit using photodiffraction

T. S. Velinov; C. W. See; Michael Geoffrey Somekh; K. L. Schumacher

doi:10.1046/j.1365-2818.1999.00424.x

Far field resolution beyond the Abbe limit using photodiffraction

T. S. Velinov, C. W. See, Michael Geoffrey Somekh, K. L. Schumacher

Research output: Journal article publication › Journal article › Academic research › peer-review

1 Citation (Scopus)

Abstract

In this paper we show how a tightly focused pump beam can be used to alter the local refractive index of the sample. This local variation acts as a scattering site, which enables resolution exceeding that of a conventional scanning microscope to be obtained in the far field. The improvement in resolution depends on a number of factors which are discussed in the paper, including the optical configuration (confocal or non-confocal), the thermal properties of the sample, the 'strength' of the object and the duration of the heating pulse. Experimental results confirming the theoretical predictions are presented; these demonstrate more than 25% improvement in edge response compared with a conventional scanning system.

Original language	English
Pages (from-to)	142-149
Number of pages	8
Journal	Journal of Microscopy
Volume	193
Issue number	2
DOIs	https://doi.org/10.1046/j.1365-2818.1999.00424.x
Publication status	Published - 1 Jan 1999
Externally published	Yes

Keywords

Abbe criterion
Confocal microscopy
Diffraction
Photothermal
Scanning optical microscopy
Superresolution

ASJC Scopus subject areas

Instrumentation

More information

10.1046/j.1365-2818.1999.00424.x

Cite this

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title = "Far field resolution beyond the Abbe limit using photodiffraction",

abstract = "In this paper we show how a tightly focused pump beam can be used to alter the local refractive index of the sample. This local variation acts as a scattering site, which enables resolution exceeding that of a conventional scanning microscope to be obtained in the far field. The improvement in resolution depends on a number of factors which are discussed in the paper, including the optical configuration (confocal or non-confocal), the thermal properties of the sample, the 'strength' of the object and the duration of the heating pulse. Experimental results confirming the theoretical predictions are presented; these demonstrate more than 25% improvement in edge response compared with a conventional scanning system.",

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AU - See, C. W.

AU - Somekh, Michael Geoffrey

AU - Schumacher, K. L.

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Y1 - 1999/1/1

N2 - In this paper we show how a tightly focused pump beam can be used to alter the local refractive index of the sample. This local variation acts as a scattering site, which enables resolution exceeding that of a conventional scanning microscope to be obtained in the far field. The improvement in resolution depends on a number of factors which are discussed in the paper, including the optical configuration (confocal or non-confocal), the thermal properties of the sample, the 'strength' of the object and the duration of the heating pulse. Experimental results confirming the theoretical predictions are presented; these demonstrate more than 25% improvement in edge response compared with a conventional scanning system.

AB - In this paper we show how a tightly focused pump beam can be used to alter the local refractive index of the sample. This local variation acts as a scattering site, which enables resolution exceeding that of a conventional scanning microscope to be obtained in the far field. The improvement in resolution depends on a number of factors which are discussed in the paper, including the optical configuration (confocal or non-confocal), the thermal properties of the sample, the 'strength' of the object and the duration of the heating pulse. Experimental results confirming the theoretical predictions are presented; these demonstrate more than 25% improvement in edge response compared with a conventional scanning system.

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KW - Confocal microscopy

KW - Diffraction

KW - Photothermal

KW - Scanning optical microscopy

KW - Superresolution

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Far field resolution beyond the Abbe limit using photodiffraction

Abstract

Keywords

ASJC Scopus subject areas

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