Abstract
In this paper we show how a tightly focused pump beam can be used to alter the local refractive index of the sample. This local variation acts as a scattering site, which enables resolution exceeding that of a conventional scanning microscope to be obtained in the far field. The improvement in resolution depends on a number of factors which are discussed in the paper, including the optical configuration (confocal or non-confocal), the thermal properties of the sample, the 'strength' of the object and the duration of the heating pulse. Experimental results confirming the theoretical predictions are presented; these demonstrate more than 25% improvement in edge response compared with a conventional scanning system.
Original language | English |
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Pages (from-to) | 142-149 |
Number of pages | 8 |
Journal | Journal of Microscopy |
Volume | 193 |
Issue number | 2 |
DOIs | |
Publication status | Published - 1 Jan 1999 |
Externally published | Yes |
Keywords
- Abbe criterion
- Confocal microscopy
- Diffraction
- Photothermal
- Scanning optical microscopy
- Superresolution
ASJC Scopus subject areas
- Instrumentation