Abstract
Planar lightwave circuits (PLC) utilizing glass related waveguide technologies are nowadays crucial components in optical communication system. In this paper, we present a standardized, silicon dioxide (SiO2) based waveguide structure prepared by plasma enhanced chemical vapor deposition (PECVD) for applications in telecommunication devices, such as wide-band optical power splitter. The index of waveguide layer can be controlled by the N2O:SiH4 ratio and process parameter. High density inductively coupled plasma (ICP) etching system was used to define the waveguide pattern. The fabricated waveguides show satisfactory optical characteristics including low waveguide loss, low chip-to-fiber coupling loss (< 0.5 dB/facet), and low polarization dependence loss (< 0.2 dB).
Original language | English |
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Pages (from-to) | 338-344 |
Number of pages | 7 |
Journal | Proceedings of SPIE - The International Society for Optical Engineering |
Volume | 4904 |
DOIs | |
Publication status | Published - Oct 2002 |
Externally published | Yes |
Event | Optical Fiber and Planar Waveguide Technology II - Shanghai, China Duration: 16 Oct 2002 → 18 Oct 2002 |
Keywords
- ICP
- PECVD
- Planar lightwave circuits (PLC)
- Silica
- Waveguide
- Waveguide loss
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering