Abstract
SBN60 films were prepared via the sol-gel route and the layer-by-layer growth technique. The films' structural quality and surface morphology were studied using X-ray diffractometry (XRD) and atomic force microscopy (AFM). Our results show that the use of crystalline and lattice matching substrates has marked effect on the films' orientation. Preferred and better-oriented (001) SBN layers have been obtained in thicker films. Enlarged and more uniformly distributed grain size and a much-reduced surface roughness have also been produced. Conditions for fabrication of dense and crack-free SBN60 films of up to 2.3 μm thick with good mean crystallinity are described.
| Original language | English |
|---|---|
| Pages (from-to) | 117-122 |
| Number of pages | 6 |
| Journal | Ferroelectrics |
| Volume | 232 |
| Issue number | 1-4 |
| DOIs | |
| Publication status | Published - 1 Jan 1999 |
Keywords
- Atomic force microscopy
- Films
- Sol-gel process
- Strontium barium niobate
- Structural properties
- X-ray methods
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
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