Fabrication and structural properties of sol-gel Sr0.6Ba0.4Nb2O6(SBN60) films

Geoffrey Kin Hung Pang, Chiu Hung Luk, Chee Leung Mak, Kin Hung Wong

Research output: Journal article publicationJournal articleAcademic researchpeer-review

Abstract

SBN60 films were prepared via the sol-gel route and the layer-by-layer growth technique. The films' structural quality and surface morphology were studied using X-ray diffractometry (XRD) and atomic force microscopy (AFM). Our results show that the use of crystalline and lattice matching substrates has marked effect on the films' orientation. Preferred and better-oriented (001) SBN layers have been obtained in thicker films. Enlarged and more uniformly distributed grain size and a much-reduced surface roughness have also been produced. Conditions for fabrication of dense and crack-free SBN60 films of up to 2.3 μm thick with good mean crystallinity are described.
Original languageEnglish
Pages (from-to)117-122
Number of pages6
JournalFerroelectrics
Volume232
Issue number1-4
DOIs
Publication statusPublished - 1 Jan 1999

Keywords

  • Atomic force microscopy
  • Films
  • Sol-gel process
  • Strontium barium niobate
  • Structural properties
  • X-ray methods

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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