Fabrication and structural properties of sol-gel Sr0.6Ba0.4Nb2O6(SBN60) films

Geoffrey Kin Hung Pang; Chiu Hung Luk; Chee Leung Mak; Kin Hung Wong

doi:10.1080/00150199908015780

Fabrication and structural properties of sol-gel Sr_0.6Ba_0.4Nb₂O₆(SBN60) films

Geoffrey Kin Hung Pang, Chiu Hung Luk, Chee Leung Mak, Kin Hung Wong

Research output: Journal article publication › Journal article › Academic research › peer-review

Abstract

SBN60 films were prepared via the sol-gel route and the layer-by-layer growth technique. The films' structural quality and surface morphology were studied using X-ray diffractometry (XRD) and atomic force microscopy (AFM). Our results show that the use of crystalline and lattice matching substrates has marked effect on the films' orientation. Preferred and better-oriented (001) SBN layers have been obtained in thicker films. Enlarged and more uniformly distributed grain size and a much-reduced surface roughness have also been produced. Conditions for fabrication of dense and crack-free SBN60 films of up to 2.3 μm thick with good mean crystallinity are described.

Original language	English
Pages (from-to)	117-122
Number of pages	6
Journal	Ferroelectrics
Volume	232
Issue number	1-4
DOIs	https://doi.org/10.1080/00150199908015780
Publication status	Published - 1 Jan 1999

Keywords

Atomic force microscopy
Films
Sol-gel process
Strontium barium niobate
Structural properties
X-ray methods

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

More information

10.1080/00150199908015780

Cite this

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title = "Fabrication and structural properties of sol-gel Sr0.6Ba0.4Nb2O6(SBN60) films",

abstract = "SBN60 films were prepared via the sol-gel route and the layer-by-layer growth technique. The films' structural quality and surface morphology were studied using X-ray diffractometry (XRD) and atomic force microscopy (AFM). Our results show that the use of crystalline and lattice matching substrates has marked effect on the films' orientation. Preferred and better-oriented (001) SBN layers have been obtained in thicker films. Enlarged and more uniformly distributed grain size and a much-reduced surface roughness have also been produced. Conditions for fabrication of dense and crack-free SBN60 films of up to 2.3 μm thick with good mean crystallinity are described.",

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AU - Luk, Chiu Hung

AU - Mak, Chee Leung

AU - Wong, Kin Hung

PY - 1999/1/1

Y1 - 1999/1/1

N2 - SBN60 films were prepared via the sol-gel route and the layer-by-layer growth technique. The films' structural quality and surface morphology were studied using X-ray diffractometry (XRD) and atomic force microscopy (AFM). Our results show that the use of crystalline and lattice matching substrates has marked effect on the films' orientation. Preferred and better-oriented (001) SBN layers have been obtained in thicker films. Enlarged and more uniformly distributed grain size and a much-reduced surface roughness have also been produced. Conditions for fabrication of dense and crack-free SBN60 films of up to 2.3 μm thick with good mean crystallinity are described.

AB - SBN60 films were prepared via the sol-gel route and the layer-by-layer growth technique. The films' structural quality and surface morphology were studied using X-ray diffractometry (XRD) and atomic force microscopy (AFM). Our results show that the use of crystalline and lattice matching substrates has marked effect on the films' orientation. Preferred and better-oriented (001) SBN layers have been obtained in thicker films. Enlarged and more uniformly distributed grain size and a much-reduced surface roughness have also been produced. Conditions for fabrication of dense and crack-free SBN60 films of up to 2.3 μm thick with good mean crystallinity are described.

KW - Atomic force microscopy

KW - Films

KW - Sol-gel process

KW - Strontium barium niobate

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