Fabrication and characterization of Ni/P(VDF-TrFE) nanoscaled coaxial cables

Cheng Liang Sun; Kwok Ho Lam; Chen Chao; Sien Ting Lau; Helen Lai Wa Chan; Shishang Guo; Xingzhong Zhao

doi:10.1063/1.2750391

Fabrication and characterization of Ni/P(VDF-TrFE) nanoscaled coaxial cables

Cheng Liang Sun
, Kwok Ho Lam
, Chen Chao
, Sien Ting Lau
, Helen Lai Wa Chan
, Shishang Guo
, Xingzhong Zhao

The Hong Kong Polytechnic University

Research output: Journal article publication › Journal article › Academic research › peer-review

15 Citations (Scopus)

Abstract

The authors have prepared poly(vinylidenefluoride-trifluoroethylene) Ni/P(VDF-TrFE) nanoscaled coaxial cables with Ni nanowires as the cores and P(VDF-TrFE) nanotubes as the shells by a two-step process. Scanning electron microscope and x-ray diffraction measurements revealed the microstructure and crystallinity of the nanocables. Electrical measurements indicated that the nanocables possessed a large specific capacitance (∼ 10.84 pC/mm2) and ferroelectric remnant polarization (∼ 10 μC/cm2) due to the composite structure. The distribution of electrical field in the nanostructure was also analyzed.

Original language	English
Article number	253107
Journal	Applied Physics Letters
Volume	90
Issue number	25
DOIs	https://doi.org/10.1063/1.2750391
Publication status	Published - 2 Aug 2007

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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10.1063/1.2750391

http://hdl.handle.net/10397/412

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title = "Fabrication and characterization of Ni/P(VDF-TrFE) nanoscaled coaxial cables",

abstract = "The authors have prepared poly(vinylidenefluoride-trifluoroethylene) Ni/P(VDF-TrFE) nanoscaled coaxial cables with Ni nanowires as the cores and P(VDF-TrFE) nanotubes as the shells by a two-step process. Scanning electron microscope and x-ray diffraction measurements revealed the microstructure and crystallinity of the nanocables. Electrical measurements indicated that the nanocables possessed a large specific capacitance (∼ 10.84 pC/mm2) and ferroelectric remnant polarization (∼ 10 μC/cm2) due to the composite structure. The distribution of electrical field in the nanostructure was also analyzed.",

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AU - Sun, Cheng Liang

AU - Lam, Kwok Ho

AU - Chao, Chen

AU - Lau, Sien Ting

AU - Chan, Helen Lai Wa

AU - Guo, Shishang

AU - Zhao, Xingzhong

PY - 2007/8/2

Y1 - 2007/8/2

N2 - The authors have prepared poly(vinylidenefluoride-trifluoroethylene) Ni/P(VDF-TrFE) nanoscaled coaxial cables with Ni nanowires as the cores and P(VDF-TrFE) nanotubes as the shells by a two-step process. Scanning electron microscope and x-ray diffraction measurements revealed the microstructure and crystallinity of the nanocables. Electrical measurements indicated that the nanocables possessed a large specific capacitance (∼ 10.84 pC/mm2) and ferroelectric remnant polarization (∼ 10 μC/cm2) due to the composite structure. The distribution of electrical field in the nanostructure was also analyzed.

AB - The authors have prepared poly(vinylidenefluoride-trifluoroethylene) Ni/P(VDF-TrFE) nanoscaled coaxial cables with Ni nanowires as the cores and P(VDF-TrFE) nanotubes as the shells by a two-step process. Scanning electron microscope and x-ray diffraction measurements revealed the microstructure and crystallinity of the nanocables. Electrical measurements indicated that the nanocables possessed a large specific capacitance (∼ 10.84 pC/mm2) and ferroelectric remnant polarization (∼ 10 μC/cm2) due to the composite structure. The distribution of electrical field in the nanostructure was also analyzed.

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DO - 10.1063/1.2750391

M3 - Journal article

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VL - 90

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 25

M1 - 253107

ER -

Fabrication and characterization of Ni/P(VDF-TrFE) nanoscaled coaxial cables

Abstract

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