Fabrication and characterization of epitaxial Sr0.6Ba0.4Nb2O6/La0.7Sr0.3CoO3heterostructures

Tsun Yu Yum; Chee Leung Mak; Kin Hung Wong

doi:10.1016/j.apsusc.2005.07.162

Fabrication and characterization of epitaxial Sr_0.6Ba_0.4Nb₂O₆/La_0.7Sr_0.3CoO₃heterostructures

Tsun Yu Yum, Chee Leung Mak, Kin Hung Wong

Research output: Journal article publication › Journal article › Academic research › peer-review

14 Citations (Scopus)

Abstract

Epitaxial Sr0.6Ba0.4Nb2O6(SBN60)/La0.7Sr0.3CoO3heterostructures were fabricated on LAO(0 0 1) substrates using pulsed laser deposition (PLD). Their structural properties were investigated by X-ray diffraction. The θ-2θ scans showed single crystalline Sr1-xBaxNb2O6(SBN) and LaxSr1-xCoO3(LSCO) layers with a 〈0 0 1〉 orientations perpendicular to the substrate plane. Phi scans on the (2 2 1) plane of SBN layer indicated that the films have two in-plane orientations with respect to the substrate. The SBN unit cells were rotated in the plane of the film by ±18.4° as well as ±45° with respect to the LAO substrate. This rotation was explained by considering the lattice matching between films and substrate, and minimization of electrostatic energy. Spectroellipsometry (SE) was used to characterize the depth profile, the microstructural inhomogeneities, including voids and surface roughness, refractive indices and extinction coefficients of the films.

Original language	English
Pages (from-to)	4829-4833
Number of pages	5
Journal	Applied Surface Science
Volume	252
Issue number	13 SPEC. ISS.
DOIs	https://doi.org/10.1016/j.apsusc.2005.07.162
Publication status	Published - 30 Apr 2006

Keywords

Epitaxial
Heterostructures
Pulsed laser deposition

ASJC Scopus subject areas

Surfaces, Coatings and Films

More information

10.1016/j.apsusc.2005.07.162

Cite this

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title = "Fabrication and characterization of epitaxial Sr0.6Ba0.4Nb2O6/La0.7Sr0.3CoO3heterostructures",

abstract = "Epitaxial Sr0.6Ba0.4Nb2O6(SBN60)/La0.7Sr0.3CoO3heterostructures were fabricated on LAO(0 0 1) substrates using pulsed laser deposition (PLD). Their structural properties were investigated by X-ray diffraction. The θ-2θ scans showed single crystalline Sr1-xBaxNb2O6(SBN) and LaxSr1-xCoO3(LSCO) layers with a 〈0 0 1〉 orientations perpendicular to the substrate plane. Phi scans on the (2 2 1) plane of SBN layer indicated that the films have two in-plane orientations with respect to the substrate. The SBN unit cells were rotated in the plane of the film by ±18.4° as well as ±45° with respect to the LAO substrate. This rotation was explained by considering the lattice matching between films and substrate, and minimization of electrostatic energy. Spectroellipsometry (SE) was used to characterize the depth profile, the microstructural inhomogeneities, including voids and surface roughness, refractive indices and extinction coefficients of the films.",

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T1 - Fabrication and characterization of epitaxial Sr0.6Ba0.4Nb2O6/La0.7Sr0.3CoO3heterostructures

AU - Yum, Tsun Yu

AU - Mak, Chee Leung

AU - Wong, Kin Hung

PY - 2006/4/30

Y1 - 2006/4/30

N2 - Epitaxial Sr0.6Ba0.4Nb2O6(SBN60)/La0.7Sr0.3CoO3heterostructures were fabricated on LAO(0 0 1) substrates using pulsed laser deposition (PLD). Their structural properties were investigated by X-ray diffraction. The θ-2θ scans showed single crystalline Sr1-xBaxNb2O6(SBN) and LaxSr1-xCoO3(LSCO) layers with a 〈0 0 1〉 orientations perpendicular to the substrate plane. Phi scans on the (2 2 1) plane of SBN layer indicated that the films have two in-plane orientations with respect to the substrate. The SBN unit cells were rotated in the plane of the film by ±18.4° as well as ±45° with respect to the LAO substrate. This rotation was explained by considering the lattice matching between films and substrate, and minimization of electrostatic energy. Spectroellipsometry (SE) was used to characterize the depth profile, the microstructural inhomogeneities, including voids and surface roughness, refractive indices and extinction coefficients of the films.

AB - Epitaxial Sr0.6Ba0.4Nb2O6(SBN60)/La0.7Sr0.3CoO3heterostructures were fabricated on LAO(0 0 1) substrates using pulsed laser deposition (PLD). Their structural properties were investigated by X-ray diffraction. The θ-2θ scans showed single crystalline Sr1-xBaxNb2O6(SBN) and LaxSr1-xCoO3(LSCO) layers with a 〈0 0 1〉 orientations perpendicular to the substrate plane. Phi scans on the (2 2 1) plane of SBN layer indicated that the films have two in-plane orientations with respect to the substrate. The SBN unit cells were rotated in the plane of the film by ±18.4° as well as ±45° with respect to the LAO substrate. This rotation was explained by considering the lattice matching between films and substrate, and minimization of electrostatic energy. Spectroellipsometry (SE) was used to characterize the depth profile, the microstructural inhomogeneities, including voids and surface roughness, refractive indices and extinction coefficients of the films.

KW - Epitaxial

KW - Heterostructures

KW - Pulsed laser deposition

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DO - 10.1016/j.apsusc.2005.07.162

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