Extension of CIE whiteness metric under different illuminants

S. Ma; J. Liang; Minchen Wei; M. R. Luo

doi:10.2352/ISSN.2169-2629.2017.32.198

Extension of CIE whiteness metric under different illuminants

S. Ma, J. Liang, Minchen Wei, M. R. Luo

Research output: Chapter in book / Conference proceeding › Conference article published in proceeding or book › Academic research › peer-review

Abstract

An experiment was conducted to extend the CIE whiteness metric under white sources having different CCTs. Three versions based on CIE whiteness index were derived and they all gave similar degree of accuracy in predicting experimental data. The one with CAT02 performed quite well and is simple to use by applying the original CIE whiteness index under D65. The tint limits were also verified and a limit of ±5T is proposed.

Original language	English
Title of host publication	CIC 2016 - 24th Color and Imaging Conference
Subtitle of host publication	Color Science and Engineering Systems, Technologies, and Applications, Final Program and Proceedings
Publisher	Society for Imaging Science and Technology
Pages	198-202
Number of pages	5
Volume	0
ISBN (Electronic)	9780892083244
DOIs	https://doi.org/10.2352/ISSN.2169-2629.2017.32.198
Publication status	Published - 1 Jan 2016
Event	24th Color and Imaging Conference: Color Science and Engineering Systems, Technologies, and Applications, CIC 2016 - Westgate Hotel, San Diego, United States Duration: 7 Nov 2016 → 11 Nov 2016

Conference

Conference	24th Color and Imaging Conference: Color Science and Engineering Systems, Technologies, and Applications, CIC 2016
Country/Territory	United States
City	San Diego
Period	7/11/16 → 11/11/16

ASJC Scopus subject areas

Computer Vision and Pattern Recognition
Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics

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10.2352/ISSN.2169-2629.2017.32.198

Cite this

Ma, S., Liang, J., Wei, M., & Luo, M. R. (2016). Extension of CIE whiteness metric under different illuminants. In CIC 2016 - 24th Color and Imaging Conference: Color Science and Engineering Systems, Technologies, and Applications, Final Program and Proceedings (Vol. 0, pp. 198-202). Society for Imaging Science and Technology. https://doi.org/10.2352/ISSN.2169-2629.2017.32.198

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Ma, S, Liang, J, Wei, M & Luo, MR 2016, Extension of CIE whiteness metric under different illuminants. in CIC 2016 - 24th Color and Imaging Conference: Color Science and Engineering Systems, Technologies, and Applications, Final Program and Proceedings. vol. 0, Society for Imaging Science and Technology, pp. 198-202, 24th Color and Imaging Conference: Color Science and Engineering Systems, Technologies, and Applications, CIC 2016, San Diego, United States, 7/11/16. https://doi.org/10.2352/ISSN.2169-2629.2017.32.198

Extension of CIE whiteness metric under different illuminants. / Ma, S.; Liang, J.; Wei, Minchen; Luo, M. R.

CIC 2016 - 24th Color and Imaging Conference: Color Science and Engineering Systems, Technologies, and Applications, Final Program and Proceedings. Vol. 0 Society for Imaging Science and Technology, 2016. p. 198-202.

Research output: Chapter in book / Conference proceeding › Conference article published in proceeding or book › Academic research › peer-review

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Extension of CIE whiteness metric under different illuminants

Abstract

Conference

ASJC Scopus subject areas

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