Extension of CIE whiteness metric under different illuminants

S. Ma, J. Liang, Minchen Wei, M. R. Luo

Research output: Chapter in book / Conference proceedingConference article published in proceeding or bookAcademic researchpeer-review

Abstract

An experiment was conducted to extend the CIE whiteness metric under white sources having different CCTs. Three versions based on CIE whiteness index were derived and they all gave similar degree of accuracy in predicting experimental data. The one with CAT02 performed quite well and is simple to use by applying the original CIE whiteness index under D65. The tint limits were also verified and a limit of ±5T is proposed.
Original languageEnglish
Title of host publicationCIC 2016 - 24th Color and Imaging Conference
Subtitle of host publicationColor Science and Engineering Systems, Technologies, and Applications, Final Program and Proceedings
PublisherSociety for Imaging Science and Technology
Pages198-202
Number of pages5
Volume0
ISBN (Electronic)9780892083244
DOIs
Publication statusPublished - 1 Jan 2016
Event24th Color and Imaging Conference: Color Science and Engineering Systems, Technologies, and Applications, CIC 2016 - Westgate Hotel, San Diego, United States
Duration: 7 Nov 201611 Nov 2016

Conference

Conference24th Color and Imaging Conference: Color Science and Engineering Systems, Technologies, and Applications, CIC 2016
CountryUnited States
CitySan Diego
Period7/11/1611/11/16

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition
  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics

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