Exchange bias effects of NiFe/NiO bilayers through ion-beam bombardment on the NiO surface

Guijun Li, Chi Wah Leung, Chin Shueh, Hsun Feng Hsu, Hsuan Rong Huang, Ko Wei Lin, Pui To Lai, Philip W.T. Pong

Research output: Journal article publicationJournal articleAcademic researchpeer-review

15 Citations (Scopus)

Abstract

The influence of ion-beam bombardment of the NiO surface on the exchange bias behavior of NiFe/NiO bilayers was systemically investigated with different bombardment energies and durations. The results show that by varying the bombardment energies, different crystallographic orientations are created which modifies the NiO spin structures. This results in the changes in the coupling type in NiO when it is in contact with the NiFe layer. The NiFe/NiO bilayers exhibited either enhanced or decreased exchange bias filed, depending on the uncompensated moments or misaligned NiO spin created by ion-beam bombardment. The variations in coercivities of NiFe/NiO bilayers imply that the NiO anisotropy could be tuned by ion-beam bombardment.
Original languageEnglish
JournalSurface and Coatings Technology
Volume228
Issue numberSUPPL.1
DOIs
Publication statusPublished - 15 Aug 2013

Keywords

  • Exchange bias
  • Ion-beam bombardment
  • Magnetic thin films

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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