Abstract
The size of an atomic force microscopy tip-top is evaluated by the measurement of desoxyribonucleic acid under atomic force microscopy. The cross section of desoxyribonucleic acid images gives the information about a tip, based on the analysis on the formation of an image under atomic force microscopy. The elements of tip images at different directions are collected and combined to form the top 2 nm tip image. The possible error of tip size determined by this method is analysed. The minimum size of feature on a sample, which could be detected by atomic force microscopy, is discussed based on the tip image.
Original language | English |
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Pages (from-to) | 783-787 |
Number of pages | 5 |
Journal | Measurement: Journal of the International Measurement Confederation |
Volume | 41 |
Issue number | 7 |
DOIs | |
Publication status | Published - 1 Aug 2008 |
Keywords
- Nano-scale pattern formation
- Scanning tunneling and atomic force microscopy
ASJC Scopus subject areas
- Engineering(all)