Epitaxial growth and optical properties of Sr2-xCaxNaNb5O15thin films by pulsed laser deposition

Y. L. Zhang, Chee Leung Mak, K. H. Wong, C. L. Choy

Research output: Journal article publicationJournal articleAcademic researchpeer-review

8 Citations (Scopus)

Abstract

High-quality Sr2-xCaxNaNb5O15(SCNN) thin films have been epitaxially grown on MgO(0 0 1) substrates by pulsed laser deposition (PLD) technique for the first time. The thickness of the films is in the range of 600-800 nm. Their structural qualities and surface morphology were studied by X-ray diffraction and scanning electron microscopy. θ-2θ scans indicate that single crystalline SCNN layers with (0 0 1) orientation perpendicular to the substrate plane were obtained. φ-scans on the (221) plane confirm that the unit cell of SCNN films rotates in the plane of the film by ±17.8° with respect to the MgO substrate unit cell. Optical studies by optical transmittance measurements were carried out in the spectral range of 200-900 nm. In the analysis of the measured optical transmittance spectra, a single electronic oscillator model was adopted to represent the refractive index and the extinction coefficient of the SCNN films. Our results suggest that PLD is a promising technique in preparing high-quality epitaxial SCNN films for electro-optic device applications.
Original languageEnglish
Pages (from-to)63-66
Number of pages4
JournalThin Solid Films
Volume449
Issue number1-2
DOIs
Publication statusPublished - 2 Feb 2004

Keywords

  • Epitaxial growth
  • Ferroelectric materials
  • Optical properties
  • Pulsed laser deposition

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

Cite this