Envelope probability and EFAST-based sensitivity analysis method for electronic prognostic uncertainty quantification

Bo Sun, Wuyang Pan, Zili Wang, Kam Chuen Yung

Research output: Journal article publicationJournal articleAcademic researchpeer-review

2 Citations (Scopus)

Abstract

The primary phase of electronic prognostic uncertainty quantification included the identification and quantification of uncertainty sources through utilizing sensitivity analysis method. An improved EFAST-based sensitivity analysis method that considered the possibility of parameter fluctuation was used to identify the key factors (KFS) of uncertainty sources. Also, an envelope probability method was adopted to further quantify the key factors of parameter distribution. Finally, a board-level electronic product was chosen as the study case of this paper. Comparing the result of uncertainty quantification, sensitivity analysis was used to drive the result of the single-dimensional method. It was obvious that the sensitivity analysis method used in this paper has optimized the input parameters of the model and improved the accuracy of electronic prognostic uncertainty quantification.
Original languageEnglish
Pages (from-to)1384-1390
Number of pages7
JournalMicroelectronics Reliability
Volume55
Issue number9-10
DOIs
Publication statusPublished - 1 Jan 2015

Keywords

  • EFAST
  • Electronic
  • Envelope-probability
  • Prognostic
  • Sensitivity analysis
  • Uncertainty

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Safety, Risk, Reliability and Quality
  • Surfaces, Coatings and Films
  • Electrical and Electronic Engineering

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