Abstract
OTFTs on glass with high-κ material HfO2as gate dielectric have been successfully fabricated. The devices show small sub-threshold slope, and thus are suitable for high-speed and low-power operations. This work also finds that OTFT with UV-ozone treatment has larger drain current, higher mobility, smaller sub-threshold slope and larger on/off ratio than the without UV-ozone treated sample. This demonstrates that the UV-ozone treatment is a promising low-temperature annealing technique for improving the OTFT performance.
Original language | English |
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Title of host publication | 2009 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2009 |
Pages | 513-516 |
Number of pages | 4 |
DOIs | |
Publication status | Published - 1 Dec 2009 |
Externally published | Yes |
Event | 2009 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2009 - Xi'an, China Duration: 25 Dec 2009 → 27 Dec 2009 |
Conference
Conference | 2009 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2009 |
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Country/Territory | China |
City | Xi'an |
Period | 25/12/09 → 27/12/09 |
ASJC Scopus subject areas
- Hardware and Architecture
- Electrical and Electronic Engineering