Electron microscopy study of interfacial structure and reaction of YBa2Cu3O7/Y-ZrO2films on LaAlO3substrates

Jiyan Dai; F. H. Kaatz; P. R. Markworth; D. B. Buchholz; X. Liu; W. A. Chiou; R. P.H. Chang

doi:10.1557/JMR.1998.0206

Electron microscopy study of interfacial structure and reaction of YBa₂Cu₃O₇/Y-ZrO₂films on LaAlO₃substrates

Jiyan Dai, F. H. Kaatz, P. R. Markworth, D. B. Buchholz, X. Liu, W. A. Chiou, R. P.H. Chang

Research output: Journal article publication › Journal article › Academic research › peer-review

4 Citations (Scopus)

Abstract

The detailed structure and interfacial reaction of epitaxial YBa2Cu3O7/Y-ZrO2(YBCO/YSZ) films grown by chemical vapor deposition (CVD) on LaAlO3(LAO) substrates are investigated by means of high-resolution electron microscopy (HREM), analytical transmission electron microscopy, and scanning transmission electron microscopy (STEM). The epitaxial relations of YBCO/YSZ/LAO are [100]YBCO//[110]YSZ// [100]LAOand (001)YBCO//(001)YSZ//(001)LAO. The optimum atomic configuration at the YSZ/LAO interface, in which oxygen is the first atomic layer on LAO, is proposed by using HREM combined with image simulation based on the atomic structure models of the interface. Near the YBCO/YSZ interface, two localized interfacial reaction products are formed: (i) a Y-rich modulated ZrO2structure at the surface of the YSZ film, which may be caused by the diffusion of Y into the YSZ grains; (ii) an intergranular BaZrO3phase formed by the diffusion of Ba along the columnar grain boundaries of the YSZ film during YBCO growth.

Original language	English
Pages (from-to)	1485-1491
Number of pages	7
Journal	Journal of Materials Research
Volume	13
Issue number	6
DOIs	https://doi.org/10.1557/JMR.1998.0206
Publication status	Published - 1 Jan 1998
Externally published	Yes

ASJC Scopus subject areas

General Materials Science
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering

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10.1557/JMR.1998.0206

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title = "Electron microscopy study of interfacial structure and reaction of YBa2Cu3O7/Y-ZrO2films on LaAlO3substrates",

abstract = "The detailed structure and interfacial reaction of epitaxial YBa2Cu3O7/Y-ZrO2(YBCO/YSZ) films grown by chemical vapor deposition (CVD) on LaAlO3(LAO) substrates are investigated by means of high-resolution electron microscopy (HREM), analytical transmission electron microscopy, and scanning transmission electron microscopy (STEM). The epitaxial relations of YBCO/YSZ/LAO are [100]YBCO//[110]YSZ// [100]LAOand (001)YBCO//(001)YSZ//(001)LAO. The optimum atomic configuration at the YSZ/LAO interface, in which oxygen is the first atomic layer on LAO, is proposed by using HREM combined with image simulation based on the atomic structure models of the interface. Near the YBCO/YSZ interface, two localized interfacial reaction products are formed: (i) a Y-rich modulated ZrO2structure at the surface of the YSZ film, which may be caused by the diffusion of Y into the YSZ grains; (ii) an intergranular BaZrO3phase formed by the diffusion of Ba along the columnar grain boundaries of the YSZ film during YBCO growth.",

author = "Jiyan Dai and Kaatz, {F. H.} and Markworth, {P. R.} and Buchholz, {D. B.} and X. Liu and Chiou, {W. A.} and Chang, {R. P.H.}",

year = "1998",

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doi = "10.1557/JMR.1998.0206",

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T1 - Electron microscopy study of interfacial structure and reaction of YBa2Cu3O7/Y-ZrO2films on LaAlO3substrates

AU - Dai, Jiyan

AU - Kaatz, F. H.

AU - Markworth, P. R.

AU - Buchholz, D. B.

AU - Liu, X.

AU - Chiou, W. A.

AU - Chang, R. P.H.

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Y1 - 1998/1/1

N2 - The detailed structure and interfacial reaction of epitaxial YBa2Cu3O7/Y-ZrO2(YBCO/YSZ) films grown by chemical vapor deposition (CVD) on LaAlO3(LAO) substrates are investigated by means of high-resolution electron microscopy (HREM), analytical transmission electron microscopy, and scanning transmission electron microscopy (STEM). The epitaxial relations of YBCO/YSZ/LAO are [100]YBCO//[110]YSZ// [100]LAOand (001)YBCO//(001)YSZ//(001)LAO. The optimum atomic configuration at the YSZ/LAO interface, in which oxygen is the first atomic layer on LAO, is proposed by using HREM combined with image simulation based on the atomic structure models of the interface. Near the YBCO/YSZ interface, two localized interfacial reaction products are formed: (i) a Y-rich modulated ZrO2structure at the surface of the YSZ film, which may be caused by the diffusion of Y into the YSZ grains; (ii) an intergranular BaZrO3phase formed by the diffusion of Ba along the columnar grain boundaries of the YSZ film during YBCO growth.

AB - The detailed structure and interfacial reaction of epitaxial YBa2Cu3O7/Y-ZrO2(YBCO/YSZ) films grown by chemical vapor deposition (CVD) on LaAlO3(LAO) substrates are investigated by means of high-resolution electron microscopy (HREM), analytical transmission electron microscopy, and scanning transmission electron microscopy (STEM). The epitaxial relations of YBCO/YSZ/LAO are [100]YBCO//[110]YSZ// [100]LAOand (001)YBCO//(001)YSZ//(001)LAO. The optimum atomic configuration at the YSZ/LAO interface, in which oxygen is the first atomic layer on LAO, is proposed by using HREM combined with image simulation based on the atomic structure models of the interface. Near the YBCO/YSZ interface, two localized interfacial reaction products are formed: (i) a Y-rich modulated ZrO2structure at the surface of the YSZ film, which may be caused by the diffusion of Y into the YSZ grains; (ii) an intergranular BaZrO3phase formed by the diffusion of Ba along the columnar grain boundaries of the YSZ film during YBCO growth.

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DO - 10.1557/JMR.1998.0206

M3 - Journal article

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Electron microscopy study of interfacial structure and reaction of YBa₂Cu₃O₇/Y-ZrO₂films on LaAlO₃substrates

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