Electric-Field-Induced Soft-Mode Hardening in SrTiO3 Films

I. A. Akimov; A. A. Sirenko; A. M. Clark; Jianhua Hao; X. X. Xi

doi:10.1103/PhysRevLett.84.4625

Electric-Field-Induced Soft-Mode Hardening in SrTiO₃ Films

I. A. Akimov, A. A. Sirenko, A. M. Clark, Jianhua Hao, X. X. Xi

Research output: Journal article publication › Journal article › Academic research › peer-review

110 Citations (Scopus)

Abstract

We have studied electric-field-induced Raman scattering in SrTiO3 thin films using an indium-tin-oxide/SrTiO3/SrRuO3 structure grown by pulsed laser deposition. The soft mode polarized along the field becomes Raman active. Experimental data for electric-field-induced hardening of the soft modes and the tuning of the static dielectric constant are in agreement described by the Lyddane-Sachs-Teller formalism. The markedly different behavior of the soft modes in thin films from that in the bulk is explained by the existence of local polar regions.

Original language	English
Pages (from-to)	4625-4628
Number of pages	4
Journal	Physical Review Letters
Volume	84
Issue number	20
DOIs	https://doi.org/10.1103/PhysRevLett.84.4625
Publication status	Published - 1 Jan 2000
Externally published	Yes

ASJC Scopus subject areas

General Physics and Astronomy

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10.1103/PhysRevLett.84.4625

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title = "Electric-Field-Induced Soft-Mode Hardening in SrTiO3 Films",

abstract = "We have studied electric-field-induced Raman scattering in SrTiO3 thin films using an indium-tin-oxide/SrTiO3/SrRuO3 structure grown by pulsed laser deposition. The soft mode polarized along the field becomes Raman active. Experimental data for electric-field-induced hardening of the soft modes and the tuning of the static dielectric constant are in agreement described by the Lyddane-Sachs-Teller formalism. The markedly different behavior of the soft modes in thin films from that in the bulk is explained by the existence of local polar regions.",

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AU - Clark, A. M.

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AU - Xi, X. X.

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Y1 - 2000/1/1

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AB - We have studied electric-field-induced Raman scattering in SrTiO3 thin films using an indium-tin-oxide/SrTiO3/SrRuO3 structure grown by pulsed laser deposition. The soft mode polarized along the field becomes Raman active. Experimental data for electric-field-induced hardening of the soft modes and the tuning of the static dielectric constant are in agreement described by the Lyddane-Sachs-Teller formalism. The markedly different behavior of the soft modes in thin films from that in the bulk is explained by the existence of local polar regions.

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Electric-Field-Induced Soft-Mode Hardening in SrTiO₃ Films

Abstract

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