Electric-Field-Induced Soft-Mode Hardening in SrTiO3 Films

I. A. Akimov; A. A. Sirenko; A. M. Clark; Jianhua Hao; X. X. Xi

doi:10.1103/PhysRevLett.84.4625

Electric-Field-Induced Soft-Mode Hardening in SrTiO₃ Films

I. A. Akimov, A. A. Sirenko, A. M. Clark, Jianhua Hao, X. X. Xi

Research output: Journal article publication › Journal article › Academic research › peer-review

96 Citations (Scopus)

Abstract

We have studied electric-field-induced Raman scattering in SrTiO3 thin films using an indium-tin-oxide/SrTiO3/SrRuO3 structure grown by pulsed laser deposition. The soft mode polarized along the field becomes Raman active. Experimental data for electric-field-induced hardening of the soft modes and the tuning of the static dielectric constant are in agreement described by the Lyddane-Sachs-Teller formalism. The markedly different behavior of the soft modes in thin films from that in the bulk is explained by the existence of local polar regions.

Original language	English
Pages (from-to)	4625-4628
Number of pages	4
Journal	Physical Review Letters
Volume	84
Issue number	20
DOIs	https://doi.org/10.1103/PhysRevLett.84.4625
Publication status	Published - 1 Jan 2000
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy(all)

More information

10.1103/PhysRevLett.84.4625

Cite this

@article{2f5c27204c58470a873bb7aabe28cc32,

title = "Electric-Field-Induced Soft-Mode Hardening in SrTiO3 Films",

abstract = "We have studied electric-field-induced Raman scattering in SrTiO3 thin films using an indium-tin-oxide/SrTiO3/SrRuO3 structure grown by pulsed laser deposition. The soft mode polarized along the field becomes Raman active. Experimental data for electric-field-induced hardening of the soft modes and the tuning of the static dielectric constant are in agreement described by the Lyddane-Sachs-Teller formalism. The markedly different behavior of the soft modes in thin films from that in the bulk is explained by the existence of local polar regions.",

author = "Akimov, {I. A.} and Sirenko, {A. A.} and Clark, {A. M.} and Jianhua Hao and Xi, {X. X.}",

year = "2000",

month = jan,

day = "1",

doi = "10.1103/PhysRevLett.84.4625",

language = "English",

volume = "84",

pages = "4625--4628",

journal = "Physical Review Letters",

issn = "0031-9007",

publisher = "American Physical Society",

number = "20",

}

TY - JOUR

T1 - Electric-Field-Induced Soft-Mode Hardening in SrTiO3 Films

AU - Akimov, I. A.

AU - Sirenko, A. A.

AU - Clark, A. M.

AU - Hao, Jianhua

AU - Xi, X. X.

PY - 2000/1/1

Y1 - 2000/1/1

N2 - We have studied electric-field-induced Raman scattering in SrTiO3 thin films using an indium-tin-oxide/SrTiO3/SrRuO3 structure grown by pulsed laser deposition. The soft mode polarized along the field becomes Raman active. Experimental data for electric-field-induced hardening of the soft modes and the tuning of the static dielectric constant are in agreement described by the Lyddane-Sachs-Teller formalism. The markedly different behavior of the soft modes in thin films from that in the bulk is explained by the existence of local polar regions.

AB - We have studied electric-field-induced Raman scattering in SrTiO3 thin films using an indium-tin-oxide/SrTiO3/SrRuO3 structure grown by pulsed laser deposition. The soft mode polarized along the field becomes Raman active. Experimental data for electric-field-induced hardening of the soft modes and the tuning of the static dielectric constant are in agreement described by the Lyddane-Sachs-Teller formalism. The markedly different behavior of the soft modes in thin films from that in the bulk is explained by the existence of local polar regions.

UR - http://www.scopus.com/inward/record.url?scp=0000263765&partnerID=8YFLogxK

U2 - 10.1103/PhysRevLett.84.4625

DO - 10.1103/PhysRevLett.84.4625

M3 - Journal article

SN - 0031-9007

VL - 84

SP - 4625

EP - 4628

JO - Physical Review Letters

JF - Physical Review Letters

IS - 20

ER -

Electric-Field-Induced Soft-Mode Hardening in SrTiO₃ Films

Abstract

ASJC Scopus subject areas

More information

Other files and links

Fingerprint

Cite this