Abstract
The relationship between microstructure and creep behavior of the gamma-TiAl alloys was analyzed and discussed, and the effect of the orientation of lamellar boundaries with fully lamellar structure was studied by using TiAl PST crystals. It has been shown that the primary microstructure parameters, which have important influences on the creep behavior, are lamellar orientations with respect to loading axis, volume fraction of gamma-grains, lamellar grain size, lamellar width and grain boundary morphology. The way to get high creep resistance by microstructure control has been suggested.
| Original language | English |
|---|---|
| Pages (from-to) | 734-737 |
| Number of pages | 4 |
| Journal | Beijing Hangkong Hangtian Daxue Xuebao/Journal of Beijing University of Aeronautics and Astronautics |
| Volume | 24 |
| Issue number | 6 |
| Publication status | Published - 1998 |
| Externally published | Yes |
ASJC Scopus subject areas
- Aerospace Engineering
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