Effects of ion beam bombardment on electrochromic tungsten oxide films studied by X-ray photoelectron spectroscopy and Rutherford back-scattering

H. Y. Wong, Chung Wo Ong, R. W.M. Kwok, K. W. Wong, S. P. Wong, W. Y. Cheung

Research output: Journal article publicationJournal articleAcademic researchpeer-review

70 Citations (Scopus)

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Material Science