Abstract
In this paper, the "sandwich" structured magnetoelectric composite films of Pb(Zr0.52Ti0.48)O3/NiFe2O4/Pb(Zr0.52Ti0.48)O3and Pb(Zr0.52Ti0.48)O3/CoFe2O4/Pb(Zr0.52Ti0.48)O3are epitaxially grown on SrRuO3/SrTiO3substrates by pulsed-laser deposition. The crystalline quality and microstructures of these heterostructures are investigated by X-ray diffraction technique. The effects of strain on the ferroelectric, magnetic and magnetoelectric coupling properties of these thin films are systematically studied. The results show that the strain effect induced by lattice mismatch between the ferroelectric/ferromagnetic layers plays an important role in the ferroelectric and magnetic properties of these composite films. Compared to the strained Pb(Zr0.52Ti0.48)O3/CoFe2O4/Pb(Zr0.52Ti0.48)O3heterostructure, improved ferroelectric properties with an out-of-plane polarization (2Pr) of 34.2 μC/cm2and electric coercivity field of 158 kV/cm are obtained in the strainfree Pb(Zr0.52Ti0.48)O3/NiFe2O4/Pb(Zr0.52Ti0.48)O3heterostructure. The ME measurement results not only show that the strain induced by lattice mismatch has great influence on the ME behavior, but also provide an understanding of the multilayers with full control over the interface structure at the atomic-scale.
Original language | English |
---|---|
Pages (from-to) | 11227-11230 |
Number of pages | 4 |
Journal | Journal of Nanoscience and Nanotechnology |
Volume | 11 |
Issue number | 12 |
DOIs | |
Publication status | Published - 1 Dec 2011 |
Keywords
- Epitaxy
- Heterostructure
- Magnetoelectric effect
- PZT
- Strain
ASJC Scopus subject areas
- Bioengineering
- General Chemistry
- Biomedical Engineering
- General Materials Science
- Condensed Matter Physics