Abstract
Sol-gel derived lead zirconate titanate (PbZr0.52Ti0.48O3, PZT) films of thickness 300 nm were deposited on RuO2/SiO2/Si and Pt/Ti/SiO2/Si substrates. Either a ruthenium dioxide (RuO2) or platinum (Pt) top electrode was deposited on each film. The ferroelectric properties and the fatigue and current characteristics of the films were investigated. The film has a higher fatigue resistance but also a higher leakage current when one or both of the electrodes are made of RuO2. The RuO2/PZT/RuO2film exhibits negligible polarization fatigue, while the polarization of the RuO2/PZT/Pt and Pt/PZT/RuO2films decreases by about 40% after 109switchings. This suggests that the polarization fatigue in the PZT films is controlled not only by the top RuO2/PZT interface but also by the bottom PZT/RuO2interface.
Original language | English |
---|---|
Pages (from-to) | 207-212 |
Number of pages | 6 |
Journal | Ferroelectrics |
Volume | 260 |
Issue number | 1 |
DOIs | |
Publication status | Published - 1 Dec 2001 |
Keywords
- fatigue
- leakage current
- PZT thin films
- RuO electrodes 2
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics