Abstract
Multilayer of SrTiO3(STO)-YBa2Cu3O7-δ(YBCO) was fabricated by laser molecular beam epitaxy (LMBE). The properties of multilayer in terms of growth modes, strain and interface structures were characterized by the in situ reflective high energy electron diffraction (RHEED) pattern, and ex situ measurements, such as atomic force microscope (AFM). By controlling growth and processing conditions, we observed a change of different growth modes of thin films. Furthermore, we also demonstrate a strong dependence of growth modes in YBCO films on the growth fashion of STO films, which could be explained in terms of the stress effect at the interface. The dependence of interface stress on thickness and growth condition was determined with AFM. These results provide an understanding and manipulating growth mechanism of the films.
Original language | English |
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Title of host publication | Physical Chemistry of Interfaces and Nanomaterials VI |
Volume | 6643 |
DOIs | |
Publication status | Published - 1 Dec 2007 |
Event | Physical Chemistry of Interfaces and Nanomaterials VI - San Diego, CA, United States Duration: 26 Aug 2007 → 28 Aug 2007 |
Conference
Conference | Physical Chemistry of Interfaces and Nanomaterials VI |
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Country/Territory | United States |
City | San Diego, CA |
Period | 26/08/07 → 28/08/07 |
Keywords
- Growth mode
- Interface
- Strain
- Titanate
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering