Dynamic surface plasmon near-field optical recording

Din Ping Tsai; Chi Wen Yang; Fu Han Ho; Shu Zee Lo; Wei Chih Lin; Ming Yish Chen; Tzu Feng Tseng; Huan Chang Lin; Chwei Jing Yeh

Dynamic surface plasmon near-field optical recording

Din Ping Tsai, Chi Wen Yang, Fu Han Ho, Shu Zee Lo, Wei Chih Lin, Ming Yish Chen, Tzu Feng Tseng, Huan Chang Lin, Chwei Jing Yeh

Research output: Journal article publication › Conference article › Academic research › peer-review

Abstract

The optical nonlinear properties of the SiN/Sb/SiN thin film are investigated. Imaging results of the near-field intensity gradients showed the intensity of the focused spot through the glass/SiN(170 nm)/Sb(15 nm)/SiN(20 nm) sample included both propagating and evanescent field intensity. The surface plasmons of the Sb/SiN interface excited by the focused laser beam play an important role in the near-field optical recording of super resolution optical near-field structure. The focused spot sizes of the evanescent field intensity can be manipulated by the detecting sensitivity of photomultiplier tube, while the focused spot sizes of the propagating intensity remained the same for different sensitivity.

Original language	English
Pages (from-to)	429-431
Number of pages	3
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	3864
Issue number	SUPPL.
Publication status	Published - 12 Jul 1999
Externally published	Yes
Event	Proceedings of the 1999 Joint International Symposium on Optical Memory and Optical Optical Data Storage (ISOM/ODS'99) - Koloa, HI, USA Duration: 12 Jul 1999 → 15 Jul 1999

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

Cite this

@article{45d2b51067e94849ad69b68f35ad8f9a,

title = "Dynamic surface plasmon near-field optical recording",

abstract = "The optical nonlinear properties of the SiN/Sb/SiN thin film are investigated. Imaging results of the near-field intensity gradients showed the intensity of the focused spot through the glass/SiN(170 nm)/Sb(15 nm)/SiN(20 nm) sample included both propagating and evanescent field intensity. The surface plasmons of the Sb/SiN interface excited by the focused laser beam play an important role in the near-field optical recording of super resolution optical near-field structure. The focused spot sizes of the evanescent field intensity can be manipulated by the detecting sensitivity of photomultiplier tube, while the focused spot sizes of the propagating intensity remained the same for different sensitivity.",

author = "Tsai, {Din Ping} and Yang, {Chi Wen} and Ho, {Fu Han} and Lo, {Shu Zee} and Lin, {Wei Chih} and Chen, {Ming Yish} and Tseng, {Tzu Feng} and Lin, {Huan Chang} and Yeh, {Chwei Jing}",

year = "1999",

month = jul,

day = "12",

language = "English",

volume = "3864",

pages = "429--431",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "SPIE",

number = "SUPPL.",

note = "Proceedings of the 1999 Joint International Symposium on Optical Memory and Optical Optical Data Storage (ISOM/ODS'99) ; Conference date: 12-07-1999 Through 15-07-1999",

}

TY - JOUR

T1 - Dynamic surface plasmon near-field optical recording

AU - Tsai, Din Ping

AU - Yang, Chi Wen

AU - Ho, Fu Han

AU - Lo, Shu Zee

AU - Lin, Wei Chih

AU - Chen, Ming Yish

AU - Tseng, Tzu Feng

AU - Lin, Huan Chang

AU - Yeh, Chwei Jing

PY - 1999/7/12

Y1 - 1999/7/12

N2 - The optical nonlinear properties of the SiN/Sb/SiN thin film are investigated. Imaging results of the near-field intensity gradients showed the intensity of the focused spot through the glass/SiN(170 nm)/Sb(15 nm)/SiN(20 nm) sample included both propagating and evanescent field intensity. The surface plasmons of the Sb/SiN interface excited by the focused laser beam play an important role in the near-field optical recording of super resolution optical near-field structure. The focused spot sizes of the evanescent field intensity can be manipulated by the detecting sensitivity of photomultiplier tube, while the focused spot sizes of the propagating intensity remained the same for different sensitivity.

AB - The optical nonlinear properties of the SiN/Sb/SiN thin film are investigated. Imaging results of the near-field intensity gradients showed the intensity of the focused spot through the glass/SiN(170 nm)/Sb(15 nm)/SiN(20 nm) sample included both propagating and evanescent field intensity. The surface plasmons of the Sb/SiN interface excited by the focused laser beam play an important role in the near-field optical recording of super resolution optical near-field structure. The focused spot sizes of the evanescent field intensity can be manipulated by the detecting sensitivity of photomultiplier tube, while the focused spot sizes of the propagating intensity remained the same for different sensitivity.

UR - http://www.scopus.com/inward/record.url?scp=0033345126&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:0033345126

SN - 0277-786X

VL - 3864

SP - 429

EP - 431

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

IS - SUPPL.

T2 - Proceedings of the 1999 Joint International Symposium on Optical Memory and Optical Optical Data Storage (ISOM/ODS'99)

Y2 - 12 July 1999 through 15 July 1999

ER -

Dynamic surface plasmon near-field optical recording

Abstract

ASJC Scopus subject areas

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