Dynamic surface plasmon near-field optical recording

Din Ping Tsai, Chi Wen Yang, Fu Han Ho, Shu Zee Lo, Wei Chih Lin, Ming Yish Chen, Tzu Feng Tseng, Huan Chang Lin, Chwei Jing Yeh

Research output: Journal article publicationConference articleAcademic researchpeer-review

Abstract

The optical nonlinear properties of the SiN/Sb/SiN thin film are investigated. Imaging results of the near-field intensity gradients showed the intensity of the focused spot through the glass/SiN(170 nm)/Sb(15 nm)/SiN(20 nm) sample included both propagating and evanescent field intensity. The surface plasmons of the Sb/SiN interface excited by the focused laser beam play an important role in the near-field optical recording of super resolution optical near-field structure. The focused spot sizes of the evanescent field intensity can be manipulated by the detecting sensitivity of photomultiplier tube, while the focused spot sizes of the propagating intensity remained the same for different sensitivity.

Original languageEnglish
Pages (from-to)429-431
Number of pages3
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume3864
Issue numberSUPPL.
Publication statusPublished - 12 Jul 1999
Externally publishedYes
EventProceedings of the 1999 Joint International Symposium on Optical Memory and Optical Optical Data Storage (ISOM/ODS'99) - Koloa, HI, USA
Duration: 12 Jul 199915 Jul 1999

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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