Abstract
Material microstructure, such as grains in metals, can perturb ultrasound as it propagates through - or on the surface of - the material. This acoustic aberration affects the accuracy and reliability of ultrasound measurements and is a fundamental limit to resolution for many materials. Using an all-optical approach to generation and detection of surface acoustic waves, we detect the acoustic wave front aberrations, and correct for them by calculating a different generation profile, which is imaged onto the material using a spatial light modulator.
| Original language | English |
|---|---|
| Pages (from-to) | 2288-2290 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 81 |
| Issue number | 12 |
| DOIs | |
| Publication status | Published - 16 Sept 2002 |
| Externally published | Yes |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)
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