Abstract
Direct experimental observation of the near-field aperture formed in the super resolution near-field structure of glass/SiN(170 nm)/Sb(15 nm)/SiN(20 nm) has been achieved using a tapping-mode tuning-fork near-field scanning optical microscope. Both propagating and evanescent field intensities were found at the focused spots of the surface of the super resolution structure. Images of the near-field intensity gradients at different excited laser powers (0.45-2.33 ?W) demonstrated that the area of the static evanescent intensity could be stably controlled. ©2000 Publication Board, Japanese Journal of Applied Physics.
| Original language | English |
|---|---|
| Pages (from-to) | 982-983 |
| Number of pages | 2 |
| Journal | Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers |
| Volume | 39 |
| Issue number | 2 B |
| Publication status | Published - 1 Dec 2000 |
| Externally published | Yes |
Keywords
- Evanescent field
- Localized surface plasmon
- Near-field optical recording
- Near-field scanning optical microscopy (NSOM)
- Super resolution near-field structure (super-RENS)
ASJC Scopus subject areas
- General Engineering
- General Physics and Astronomy