Dynamic aperture of near-field super resolution structures

Din-ping Tsai, C.W. Yang, W.C. Lin, F.H. Ho, H.J. Huang, M.Y. Chen, T.F. Tseng, C.H. Lee, C.J. Yeh

Research output: Journal article publicationJournal articleAcademic researchpeer-review

44 Citations (Scopus)

Abstract

Direct experimental observation of the near-field aperture formed in the super resolution near-field structure of glass/SiN(170 nm)/Sb(15 nm)/SiN(20 nm) has been achieved using a tapping-mode tuning-fork near-field scanning optical microscope. Both propagating and evanescent field intensities were found at the focused spots of the surface of the super resolution structure. Images of the near-field intensity gradients at different excited laser powers (0.45-2.33 ?W) demonstrated that the area of the static evanescent intensity could be stably controlled. ©2000 Publication Board, Japanese Journal of Applied Physics.
Original languageEnglish
Pages (from-to)982-983
Number of pages2
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume39
Issue number2 B
Publication statusPublished - 1 Dec 2000
Externally publishedYes

Keywords

  • Evanescent field
  • Localized surface plasmon
  • Near-field optical recording
  • Near-field scanning optical microscopy (NSOM)
  • Super resolution near-field structure (super-RENS)

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

Cite this