Dislocation density in SrTiO3film grown on DyScO3by pulse laser ablation

Z. Y. Zhai, X. Z. Li, S. S. Zhi, X. S. Wu, Jianhua Hao, J. Gao

Research output: Journal article publicationJournal articleAcademic researchpeer-review

Abstract

SrTiO3films are fabricated on DyScO3substrates by pulse laser deposition. In situ X-ray diffraction (XRD) is used to characterize the thermal expansion coefficient at low temperature. The abnormal behavior in lattice parameter at 80K may be the hint of a phase transition. High resolution XRD is performed to detect the two kinds of dislocations, i.e. screw and edge. Results show that the density of edge dislocation is a little larger than that of the screw one. The total dislocation density has the order of about 10 cm . Edge dislocation density decreases with the increase of the film thickness. We argue that the ratio between these two dislocation densities results in the growth mode of the film.
Original languageEnglish
Pages (from-to)779-782
Number of pages4
JournalSurface Review and Letters
Volume14
Issue number4
DOIs
Publication statusPublished - 1 Aug 2007

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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