Direct and indirect dual-probe interferometers for accurate surface wave measurements

H. P. Ho; Michael Geoffrey Somekh; M. Liu; C. W. See

doi:10.1088/0957-0233/5/12/009

Direct and indirect dual-probe interferometers for accurate surface wave measurements

H. P. Ho, Michael Geoffrey Somekh, M. Liu, C. W. See

Research output: Journal article publication › Journal article › Academic research › peer-review

6 Citations (Scopus)

Abstract

This paper describes the development and operation of two dual-probe interference systems for detection of surface acoustic waves. Both systems operate by comparing the surface displacement under each probe, thus enabling the surface wave velocity to be determined. In the so-called direct interference system the two probe beams are made to interfere with each other whereas in the indirect interference system each probe beam is made to interfere with a common reference. The relative merits of each system are compared in detail and experimental results showing operation of the systems are presented.

Original language	English
Article number	009
Pages (from-to)	1480-1490
Number of pages	11
Journal	Measurement Science and Technology
Volume	5
Issue number	12
DOIs	https://doi.org/10.1088/0957-0233/5/12/009
Publication status	Published - 1 Dec 1994
Externally published	Yes

ASJC Scopus subject areas

Instrumentation
Engineering (miscellaneous)
Applied Mathematics

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10.1088/0957-0233/5/12/009

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AB - This paper describes the development and operation of two dual-probe interference systems for detection of surface acoustic waves. Both systems operate by comparing the surface displacement under each probe, thus enabling the surface wave velocity to be determined. In the so-called direct interference system the two probe beams are made to interfere with each other whereas in the indirect interference system each probe beam is made to interfere with a common reference. The relative merits of each system are compared in detail and experimental results showing operation of the systems are presented.

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Direct and indirect dual-probe interferometers for accurate surface wave measurements

Abstract

ASJC Scopus subject areas

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