Direct Analysis of an Ultrahigh-Voltage Lattice Transmission Tower Considering Joint Effects

Wen Qiang Jiang, Yao Peng Liu, Siu Lai Chan, Zhang Qi Wang

Research output: Journal article publicationJournal articleAcademic researchpeer-review

41 Citations (Scopus)


Transmission towers play an important role in transmitting electricity in a power grid safely and reliably. In traditional design practice, the second-order P-Δ (frame side sway) and P-δ (member curvature) effects and joint effects such as load eccentricities, slippage effects, and semirigid connection are commonly ignored in analysis. Great discrepancy is frequently noted between full-scale tower tests and numerical simulations using first-order linear analysis. In this paper, second-order direct analysis is used and slippage of bolted joints as well as semirigid connection behavior are taken into account. Member initial bowing and frame out-of-plumbness imperfections are considered in the present study, which is verified by full-scale test on an ultrahigh-voltage (UHV) lattice transmission tower. The technique of semirigid design and simulation of joint stiffness for load eccentricity by simple modeling for transmission towers meeting the requirements for direct analysis with verification by a full-scale test is unavailable in literature and proposed in this paper. Furthermore, the influences of joint slippage on the deflection and load behavior of the studied towers are quantified and reported.

Original languageEnglish
Article number04017009
JournalJournal of Structural Engineering (United States)
Issue number5
Publication statusPublished - 1 May 2017


  • Analysis and computation
  • Joint effects
  • Joint slippage
  • Second-order direct analysis
  • Semirigid connection
  • Ultrahigh-voltage (UHV) lattice transmission tower

ASJC Scopus subject areas

  • Civil and Structural Engineering
  • Building and Construction
  • Materials Science(all)
  • Mechanics of Materials
  • Mechanical Engineering


Dive into the research topics of 'Direct Analysis of an Ultrahigh-Voltage Lattice Transmission Tower Considering Joint Effects'. Together they form a unique fingerprint.

Cite this