Digital-based technology for fabric structure analysis

B. Xin; Jinlian Hu; George Baciu; X. Yu

doi:10.1016/B978-1-84569-729-7.50002-7

Digital-based technology for fabric structure analysis

B. Xin, Jinlian Hu, George Baciu, X. Yu

Research output: Chapter in book / Conference proceeding › Chapter in an edited book (as author) › Academic research › peer-review

1 Citation (Scopus)

Abstract

In this chapter, typical applications of image-based technologies used for the analysis of fabric structure and texture are summarized and discussed. Among them, a new digital method, based on the dual side scanning and active grid model (AGM), is introduced to demonstrate how to identify the weave pattern of woven fabrics. Some preliminary experiments and discussions are also included to validate this method.

Original language	English
Title of host publication	Computer Technology for Textiles and Apparel
Publisher	Elsevier Inc.
Pages	23-44
Number of pages	22
ISBN (Print)	9781845697297
DOIs	https://doi.org/10.1016/B978-1-84569-729-7.50002-7
Publication status	Published - 1 Jul 2011

Keywords

Active grid model
Dual side scanning
Fabric structure
Image analysis
Weave pattern

ASJC Scopus subject areas

General Engineering

More information

10.1016/B978-1-84569-729-7.50002-7

Cite this

@inbook{da9f583527534b81a117c4cb8164d946,

title = "Digital-based technology for fabric structure analysis",

abstract = "In this chapter, typical applications of image-based technologies used for the analysis of fabric structure and texture are summarized and discussed. Among them, a new digital method, based on the dual side scanning and active grid model (AGM), is introduced to demonstrate how to identify the weave pattern of woven fabrics. Some preliminary experiments and discussions are also included to validate this method.",

keywords = "Active grid model, Dual side scanning, Fabric structure, Image analysis, Weave pattern",

author = "B. Xin and Jinlian Hu and George Baciu and X. Yu",

year = "2011",

month = jul,

day = "1",

doi = "10.1016/B978-1-84569-729-7.50002-7",

language = "English",

isbn = "9781845697297",

pages = "23--44",

booktitle = "Computer Technology for Textiles and Apparel",

publisher = "Elsevier Inc.",

address = "United States",

}

TY - CHAP

T1 - Digital-based technology for fabric structure analysis

AU - Xin, B.

AU - Hu, Jinlian

AU - Baciu, George

AU - Yu, X.

PY - 2011/7/1

Y1 - 2011/7/1

N2 - In this chapter, typical applications of image-based technologies used for the analysis of fabric structure and texture are summarized and discussed. Among them, a new digital method, based on the dual side scanning and active grid model (AGM), is introduced to demonstrate how to identify the weave pattern of woven fabrics. Some preliminary experiments and discussions are also included to validate this method.

AB - In this chapter, typical applications of image-based technologies used for the analysis of fabric structure and texture are summarized and discussed. Among them, a new digital method, based on the dual side scanning and active grid model (AGM), is introduced to demonstrate how to identify the weave pattern of woven fabrics. Some preliminary experiments and discussions are also included to validate this method.

KW - Active grid model

KW - Dual side scanning

KW - Fabric structure

KW - Image analysis

KW - Weave pattern

UR - http://www.scopus.com/inward/record.url?scp=84903659504&partnerID=8YFLogxK

U2 - 10.1016/B978-1-84569-729-7.50002-7

DO - 10.1016/B978-1-84569-729-7.50002-7

M3 - Chapter in an edited book (as author)

SN - 9781845697297

SP - 23

EP - 44

BT - Computer Technology for Textiles and Apparel

PB - Elsevier Inc.

ER -

Digital-based technology for fabric structure analysis

Abstract

Keywords

ASJC Scopus subject areas

More information

Other files and links

Fingerprint

Cite this