Digital-based technology for fabric structure analysis

B. Xin, Jinlian Hu, George Baciu, X. Yu

Research output: Chapter in book / Conference proceedingChapter in an edited book (as author)Academic researchpeer-review

1 Citation (Scopus)

Abstract

In this chapter, typical applications of image-based technologies used for the analysis of fabric structure and texture are summarized and discussed. Among them, a new digital method, based on the dual side scanning and active grid model (AGM), is introduced to demonstrate how to identify the weave pattern of woven fabrics. Some preliminary experiments and discussions are also included to validate this method.
Original languageEnglish
Title of host publicationComputer Technology for Textiles and Apparel
PublisherElsevier Inc.
Pages23-44
Number of pages22
ISBN (Print)9781845697297
DOIs
Publication statusPublished - 1 Jul 2011

Keywords

  • Active grid model
  • Dual side scanning
  • Fabric structure
  • Image analysis
  • Weave pattern

ASJC Scopus subject areas

  • Engineering(all)

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