Abstract
In this chapter, typical applications of image-based technologies used for the analysis of fabric structure and texture are summarized and discussed. Among them, a new digital method, based on the dual side scanning and active grid model (AGM), is introduced to demonstrate how to identify the weave pattern of woven fabrics. Some preliminary experiments and discussions are also included to validate this method.
| Original language | English |
|---|---|
| Title of host publication | Computer technology for textiles and apparel |
| Publisher | Woodhead Pub. in association with the Textile Institute |
| Pages | 23-44 |
| Number of pages | 22 |
| ISBN (Print) | 1845697294, 9781845697297 |
| DOIs | |
| Publication status | Published - 2011 |
Keywords
- Image analysis
- Weave pattern
- Dual side scanning
- Active grid model
- Fabric structure