Dielectric properties and relaxation of SrBi2(Nb0.25Ta0.75)2O9ceramic at RF frequency

Jun Zheng Liu, Kin Wing Kwok, H. L.W. Chan, C. L. Choy

Research output: Journal article publicationJournal articleAcademic researchpeer-review

1 Citation (Scopus)

Abstract

The dielectric properties and relaxation of the SrBi2(Nb0.25Ta0.75)2O9ceramic were investigated from 3 to 300 MHz using frequency domain measurement by an impedance spectroscopy. Our results show that the dielectric relaxation of the ceramic can be understood in terms of power law dependence known as the Curie-von Schweidler law. It is assumed that defects, Schottkey jumps of electrons between localized states and the motions of ions play an important role in the dielectric properties and relaxation of the ceramic. The ceramic has large relative permittivity (εr∼117 at 300 MHz), low dielectric loss (tanδe<0.018 at 300 MHz) and small dispersion (<3% decrease in εrfrom 3 to 300 MHz). The Curie temperature of the ceramic is very high (∼370 °C), implying that it has a small temperature coefficient. Hence the SrBi2(Nb0.25Ta0.75)2O9ceramic is a potential candidate for microwave applications.
Original languageEnglish
Pages (from-to)1769-1773
Number of pages5
JournalJournal of the European Ceramic Society
Volume24
Issue number6
DOIs
Publication statusPublished - 1 Jan 2004

Keywords

  • Dielectric properties
  • Microwave applications
  • Relaxation
  • RF frequency
  • SrBi (Nb Ta ) O ceramic 2 0.25 0.75 2 9

ASJC Scopus subject areas

  • Ceramics and Composites
  • Materials Chemistry

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