Dielectric loss and defect mode of SrTiO3thin films under direct-current bias

Chen Ang; L. E. Cross; Zhi Yu; Ruyan Guo; A. S. Bhalla; Jianhua Hao

doi:10.1063/1.1367299

Dielectric loss and defect mode of SrTiO₃thin films under direct-current bias

Chen Ang, L. E. Cross, Zhi Yu, Ruyan Guo, A. S. Bhalla, Jianhua Hao

Research output: Journal article publication › Journal article › Academic research › peer-review

45 Citations (Scopus)

Abstract

The dielectric behavior of SrTiO3thin films prepared by the pulsed-laser deposition technique on SrTiO3single-crystal substrates is studied under dc electric field. A high dielectric constant maximum εmax(∼2280) and a low-loss tan δ (∼0.001) are obtained. Compared with the observation in SrTiO3single crystals, an additional dielectric loss peak with frequency dispersion is observed around 150 K (at 1 kHz). With increasing dc bias, the peak is suppressed and finally disappears at ∼350 kV/cm; however, the temperature at which the peak occurs is independent of electric field. The possible physical mechanism of the peak is briefly discussed.

Original language	English
Pages (from-to)	2754-2756
Number of pages	3
Journal	Applied Physics Letters
Volume	78
Issue number	18
DOIs	https://doi.org/10.1063/1.1367299
Publication status	Published - 30 Apr 2001
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

More information

10.1063/1.1367299

Cite this

@article{698721d2e531447f8f2766dc96f60e42,

title = "Dielectric loss and defect mode of SrTiO3thin films under direct-current bias",

abstract = "The dielectric behavior of SrTiO3thin films prepared by the pulsed-laser deposition technique on SrTiO3single-crystal substrates is studied under dc electric field. A high dielectric constant maximum εmax(∼2280) and a low-loss tan δ (∼0.001) are obtained. Compared with the observation in SrTiO3single crystals, an additional dielectric loss peak with frequency dispersion is observed around 150 K (at 1 kHz). With increasing dc bias, the peak is suppressed and finally disappears at ∼350 kV/cm; however, the temperature at which the peak occurs is independent of electric field. The possible physical mechanism of the peak is briefly discussed.",

author = "Chen Ang and Cross, {L. E.} and Zhi Yu and Ruyan Guo and Bhalla, {A. S.} and Jianhua Hao",

year = "2001",

month = apr,

day = "30",

doi = "10.1063/1.1367299",

language = "English",

volume = "78",

pages = "2754--2756",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "18",

}

TY - JOUR

T1 - Dielectric loss and defect mode of SrTiO3thin films under direct-current bias

AU - Ang, Chen

AU - Cross, L. E.

AU - Yu, Zhi

AU - Guo, Ruyan

AU - Bhalla, A. S.

AU - Hao, Jianhua

PY - 2001/4/30

Y1 - 2001/4/30

N2 - The dielectric behavior of SrTiO3thin films prepared by the pulsed-laser deposition technique on SrTiO3single-crystal substrates is studied under dc electric field. A high dielectric constant maximum εmax(∼2280) and a low-loss tan δ (∼0.001) are obtained. Compared with the observation in SrTiO3single crystals, an additional dielectric loss peak with frequency dispersion is observed around 150 K (at 1 kHz). With increasing dc bias, the peak is suppressed and finally disappears at ∼350 kV/cm; however, the temperature at which the peak occurs is independent of electric field. The possible physical mechanism of the peak is briefly discussed.

AB - The dielectric behavior of SrTiO3thin films prepared by the pulsed-laser deposition technique on SrTiO3single-crystal substrates is studied under dc electric field. A high dielectric constant maximum εmax(∼2280) and a low-loss tan δ (∼0.001) are obtained. Compared with the observation in SrTiO3single crystals, an additional dielectric loss peak with frequency dispersion is observed around 150 K (at 1 kHz). With increasing dc bias, the peak is suppressed and finally disappears at ∼350 kV/cm; however, the temperature at which the peak occurs is independent of electric field. The possible physical mechanism of the peak is briefly discussed.

UR - http://www.scopus.com/inward/record.url?scp=0035971675&partnerID=8YFLogxK

U2 - 10.1063/1.1367299

DO - 10.1063/1.1367299

M3 - Journal article

SN - 0003-6951

VL - 78

SP - 2754

EP - 2756

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 18

ER -

Dielectric loss and defect mode of SrTiO₃thin films under direct-current bias

Abstract

ASJC Scopus subject areas

More information

Other files and links

Fingerprint

Cite this