Dielectric loss and defect mode of SrTiO3thin films under direct-current bias

Chen Ang, L. E. Cross, Zhi Yu, Ruyan Guo, A. S. Bhalla, Jianhua Hao

Research output: Journal article publicationJournal articleAcademic researchpeer-review

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The dielectric behavior of SrTiO3thin films prepared by the pulsed-laser deposition technique on SrTiO3single-crystal substrates is studied under dc electric field. A high dielectric constant maximum εmax(∼2280) and a low-loss tan δ (∼0.001) are obtained. Compared with the observation in SrTiO3single crystals, an additional dielectric loss peak with frequency dispersion is observed around 150 K (at 1 kHz). With increasing dc bias, the peak is suppressed and finally disappears at ∼350 kV/cm; however, the temperature at which the peak occurs is independent of electric field. The possible physical mechanism of the peak is briefly discussed.
Original languageEnglish
Pages (from-to)2754-2756
Number of pages3
JournalApplied Physics Letters
Issue number18
Publication statusPublished - 30 Apr 2001
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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