Abstract
Cutting force and its power spectrum analysis was thought to be an effective method monitoring tool wear in many cutting processes and a significant body of research has been conducted on this research area. However, relative little similar research was found in ultra-precision fly cutting. In this paper, a group of experiments were carried out to investigate the cutting forces and its power spectrum characteristics under different tool wear stages. Result reveals that the cutting force increases with the progress of tool wear. The cutting force signals under different tool wear stages were analyzed using power spectrum analysis. The analysis indicates that a characteristic frequency does exist in the power spectrum of the cutting force, whose power spectral density increases with the increasing of tool wear level, this characteristic frequency could be adopted to monitor diamond tool wear in ultra-precision fly cutting.
Original language | English |
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Title of host publication | 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies |
Subtitle of host publication | Advanced Optical Manufacturing Technologies |
Publisher | SPIE |
Volume | 9281 |
ISBN (Electronic) | 9781628413564 |
DOIs | |
Publication status | Published - 1 Jan 2014 |
Event | 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, AOMATT 2014 - Harbin International Conference Center, Harbin, China Duration: 26 Apr 2014 → 29 Apr 2014 |
Conference
Conference | 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, AOMATT 2014 |
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Country/Territory | China |
City | Harbin |
Period | 26/04/14 → 29/04/14 |
Keywords
- cutting force
- diamond tool wear
- power spectrum analysis
- Ultra-precision fly cutting
ASJC Scopus subject areas
- Applied Mathematics
- Computer Science Applications
- Electrical and Electronic Engineering
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics