Abstract
Under the auspices of the Asian-Pacific Network of Centers for Research in Smart Structures Technology (ANCRiSST) and the International Society for Structural Health Monitoring of Intelligent Infrastructure (ISHMII), a structural health monitoring benchmark problem for highrise slender structures is being developed by taking the instrumented Guangzhou New Television Tower as a test bed. The benchmark problem consists of the following four tasks: (i) output-only modal identification and finite element model updating, (ii) damage detection using simulated data, (iii) optimal sensor placement for structural health monitoring, and (iv) damage detection using field measurement data. This paper will address some key issues related to the development of this first benchmark problem for high-rise structures. More details of the study can be found in the website: http://www.cse.polyu.edu.hk/benchmark/index.htm
Original language | English |
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Title of host publication | CIMTEC 2008 - Proceedings of the 3rd International Conference on Smart Materials, Structures and Systems - Emboding Intelligence in Structures and Integrated Systems |
Publisher | Trans Tech Publications Ltd |
Pages | 489-494 |
Number of pages | 6 |
Volume | 56 |
ISBN (Print) | 9783908158134 |
DOIs | |
Publication status | Published - 1 Jan 2008 |
Event | 3rd International Conference on Smart Materials, Structures and Systems - Embodying Intelligence in Structures and Integrated Systems, CIMTEC 2008 - Acireale, Sicily, Italy Duration: 8 Jun 2008 → 13 Jun 2008 |
Conference
Conference | 3rd International Conference on Smart Materials, Structures and Systems - Embodying Intelligence in Structures and Integrated Systems, CIMTEC 2008 |
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Country/Territory | Italy |
City | Acireale, Sicily |
Period | 8/06/08 → 13/06/08 |
Keywords
- Benchmark problem
- Damage identification
- High-rise structure
- Model updating
- Optimal sensor placement
- Structural health monitoring
ASJC Scopus subject areas
- Control and Systems Engineering
- Mechanics of Materials
- General Materials Science