Determining Young's modulus of conductive thin films by a thermal bend beam test

W. Shen, Chak Yin Tang, W. Li, L. H. Peng

Research output: Journal article publicationJournal articleAcademic researchpeer-review

2 Citations (Scopus)

Abstract

An experimental method used to measure the Young's modulus of the conductive thin film is proposed in this paper. This technology has utilized the electrothermal effect and strain response of conductive thin film coatings on glass substrates. On the basis of the thermo-elastic analysis of composite mechanics, the measurement principle and corresponding formula are given. The Young's modulus of conductive SnO2thin film has been estimated by means of the formula and the thermal bend beam test presented.
Original languageEnglish
Pages (from-to)163-168
Number of pages6
JournalJournal of Strain Analysis for Engineering Design
Volume36
Issue number2
DOIs
Publication statusPublished - 1 Dec 2001

Keywords

  • Conductive thin film
  • Electrothermal effect
  • Strain response
  • Thermal bend test
  • Young's modulus

ASJC Scopus subject areas

  • Modelling and Simulation
  • Mechanics of Materials
  • Mechanical Engineering
  • Applied Mathematics

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