Abstract
An experimental method used to measure the Young's modulus of the conductive thin film is proposed in this paper. This technology has utilized the electrothermal effect and strain response of conductive thin film coatings on glass substrates. On the basis of the thermo-elastic analysis of composite mechanics, the measurement principle and corresponding formula are given. The Young's modulus of conductive SnO2thin film has been estimated by means of the formula and the thermal bend beam test presented.
Original language | English |
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Pages (from-to) | 163-168 |
Number of pages | 6 |
Journal | Journal of Strain Analysis for Engineering Design |
Volume | 36 |
Issue number | 2 |
DOIs | |
Publication status | Published - 1 Dec 2001 |
Keywords
- Conductive thin film
- Electrothermal effect
- Strain response
- Thermal bend test
- Young's modulus
ASJC Scopus subject areas
- Modelling and Simulation
- Mechanics of Materials
- Mechanical Engineering
- Applied Mathematics