Determining uncertainties and their propagation in classified remotely sensed image-based dynamic change detection

Wen Zhong Shi, Manfred Ehlers

Research output: Chapter in book / Conference proceedingConference article published in proceeding or bookAcademic researchpeer-review

Abstract

This paper provides an approach to determine uncertainties and their propagation in remotely sensed images-based dynamic change detection. In this approach, uncertainties of a classified image using maximum likelihood classification method for each date is firstly determined. The probability vectors which are generated during maximum likelihood classification are used as the uncertainty indicators. The second problem is to determine uncertainty propagation when multi-images are compared to detect changes of land cover. The problem is defined by formulating them in a mathematical language to facilitate the following analyses. Two techniques are used to determine the propagation of uncertainties in the comparison two classified images. One is based on the product rule in probability theory and the other is based on the certainty factor (CF) model with probabilistic interpretation. The third problem is to represent uncertainties to communicate them to the users. Two forms of results are presented in the paper: (a) statistics tables and (b) 3D plus colour figures.
Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherSociety of Photo-Optical Instrumentation Engineers
Pages270-281
Number of pages12
Volume2315
ISBN (Print)0819416452
Publication statusPublished - 1 Dec 1994
Externally publishedYes
EventImage and Signal Processing for Remote Sensing - Rome, Italy
Duration: 26 Sep 199430 Sep 1994

Conference

ConferenceImage and Signal Processing for Remote Sensing
Country/TerritoryItaly
CityRome
Period26/09/9430/09/94

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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