Determining changes in metallic nanoparticles due to sputter cleaning

B. Buades, W. A. Okell, Y. Sonnefraud, J. Hengster, Dangyuan Lei, T. Uphues, S. A. Maier, J. P. Marangos, J. W.G. Tisch

Research output: Chapter in book / Conference proceedingConference article published in proceeding or bookAcademic researchpeer-review

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