Determining changes in metallic nanoparticles due to sputter cleaning

B. Buades, W. A. Okell, Y. Sonnefraud, J. Hengster, Dangyuan Lei, T. Uphues, S. A. Maier, J. P. Marangos, J. W.G. Tisch

Research output: Chapter in book / Conference proceeding › Conference article published in proceeding or book › Academic research › peer-review

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Keyphrases

Engineering

Material Science

Physics