Detection of stochastic high impedance faults – a method based on wavelet transform

T. Lai, L.A. Snider, Wai Chau Edward Lo

Research output: Unpublished conference presentation (presented paper, abstract, poster)Conference presentation (not published in journal/proceeding/book)Academic researchpeer-review

Original languageEnglish
Publication statusPublished - 2003
EventInternational Conference on Electrial Engineering -
Duration: 1 Jan 2003 → …

Conference

ConferenceInternational Conference on Electrial Engineering
Period1/01/03 → …

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