Detection of machine failure: Hidden Markov Model approach

Allen H. Tai, Wai Ki Ching, L. Y. Chan

Research output: Journal article publicationJournal articleAcademic researchpeer-review

46 Citations (Scopus)

Abstract

Hidden Markov Models (HMMs) are widely used in applied sciences and engineering. The potential applications in manufacturing industries have not yet been fully explored. In this paper, we propose to apply HMM to detect machine failure in process control. We propose models for both cases of indistinguishable production units and distinguishable production units. Numerical examples are given to illustrate the effectiveness of the proposed models.

Original languageEnglish
Pages (from-to)608-619
Number of pages12
JournalComputers and Industrial Engineering
Volume57
Issue number2
DOIs
Publication statusPublished - Sep 2009

Keywords

  • Hidden Markov Model
  • Machine failure
  • Statistical control process
  • Transition probability

ASJC Scopus subject areas

  • Computer Science(all)
  • Engineering(all)

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