Deep Learning Based Attack on Phase-Truncated Optical Encoding

Lina Zhou, Xudong Chen, Wen Chen

Research output: Chapter in book / Conference proceedingConference article published in proceeding or bookAcademic researchpeer-review

Abstract

We apply the learning based attack to study the vulnerability of phase-truncated optical encoding scheme. By using a number of ciphertext-plaintext pairs to train a designed learning model, an attacker can effectively analyze the vulnerability of optical encryption scheme based on phase truncation. The learning based attacks for phase-truncated optical encoding can retrieve unknown plaintexts from the given ciphertexts, which can avoid the retrieval of security keys and the design of complex phase retrieval algorithms. It is demonstrated that the learning based attack can provide a promising approach for vulnerability analysis of phase-truncated optical cryptosystems.

Original languageEnglish
Title of host publication2020 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization, NEMO 2020
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781728169668
DOIs
Publication statusPublished - 7 Dec 2020
Event2020 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization, NEMO 2020 - Hangzhou, China
Duration: 7 Dec 20209 Dec 2020

Publication series

Name2020 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization, NEMO 2020

Conference

Conference2020 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization, NEMO 2020
Country/TerritoryChina
CityHangzhou
Period7/12/209/12/20

Keywords

  • learning based attacks
  • optical encoding
  • phase truncation

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Signal Processing
  • Electronic, Optical and Magnetic Materials
  • Control and Optimization
  • Modelling and Simulation
  • Instrumentation

Cite this