Corrigendum to “Improving PCB defect detection using selective feature attention and pixel shuffle pyramid” [Results. Eng. 21 (2024) 101992] (Results in Engineering (2024) 21, (S2590123024002457), (10.1016/j.rineng.2024.101992))

Ka Chun Fung; Kai Wen Xue; Cheung Ming Lai; Kwan Ho Lin; Kin Man Lam

doi:10.1016/j.rineng.2024.102045

Corrigendum to “Improving PCB defect detection using selective feature attention and pixel shuffle pyramid” [Results. Eng. 21 (2024) 101992] (Results in Engineering (2024) 21, (S2590123024002457), (10.1016/j.rineng.2024.101992))

Ka Chun Fung
, Kai Wen Xue
, Cheung Ming Lai
, Kwan Ho Lin
, Kin Man Lam

Research output: Journal article publication › Comment/debate/erratum

Abstract

The authors regret not including the following acknowledgement in the published version of the above-mentioned article Acknowledgement The work presented in this article is supported by Centre for Advances in Reliability and Safety (CAiRS) admitted under AIR@InnoHK Research Cluster. The authors would like to apologise for any inconvenience caused.

Original language	English
Article number	102045
Journal	Results in Engineering
DOIs	https://doi.org/10.1016/j.rineng.2024.102045
Publication status	Published - Mar 2024

ASJC Scopus subject areas

General Engineering

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10.1016/j.rineng.2024.102045

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Fung, K. C., Xue, K. W., Lai, C. M., Lin, K. H., & Lam, K. M. (2024). Corrigendum to “Improving PCB defect detection using selective feature attention and pixel shuffle pyramid” [Results. Eng. 21 (2024) 101992] (Results in Engineering (2024) 21, (S2590123024002457), (10.1016/j.rineng.2024.101992)). Results in Engineering, Article 102045. https://doi.org/10.1016/j.rineng.2024.102045

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title = "Corrigendum to “Improving PCB defect detection using selective feature attention and pixel shuffle pyramid” [Results. Eng. 21 (2024) 101992] (Results in Engineering (2024) 21, (S2590123024002457), (10.1016/j.rineng.2024.101992))",

abstract = "The authors regret not including the following acknowledgement in the published version of the above-mentioned article Acknowledgement The work presented in this article is supported by Centre for Advances in Reliability and Safety (CAiRS) admitted under AIR@InnoHK Research Cluster. The authors would like to apologise for any inconvenience caused.",

author = "Fung, \{Ka Chun\} and Xue, \{Kai Wen\} and Lai, \{Cheung Ming\} and Lin, \{Kwan Ho\} and Lam, \{Kin Man\}",

note = "Publisher Copyright: {\textcopyright} 2024",

year = "2024",

month = mar,

doi = "10.1016/j.rineng.2024.102045",

language = "English",

journal = "Results in Engineering",

issn = "2590-1230",

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Corrigendum to “Improving PCB defect detection using selective feature attention and pixel shuffle pyramid” [Results. Eng. 21 (2024) 101992] (Results in Engineering (2024) 21, (S2590123024002457), (10.1016/j.rineng.2024.101992)). / Fung, Ka Chun; Xue, Kai Wen; Lai, Cheung Ming et al.
In: Results in Engineering, 03.2024.

Research output: Journal article publication › Comment/debate/erratum

TY - JOUR

T1 - Corrigendum to “Improving PCB defect detection using selective feature attention and pixel shuffle pyramid” [Results. Eng. 21 (2024) 101992] (Results in Engineering (2024) 21, (S2590123024002457), (10.1016/j.rineng.2024.101992))

AU - Fung, Ka Chun

AU - Xue, Kai Wen

AU - Lai, Cheung Ming

AU - Lin, Kwan Ho

AU - Lam, Kin Man

PY - 2024/3

Y1 - 2024/3

N2 - The authors regret not including the following acknowledgement in the published version of the above-mentioned article Acknowledgement The work presented in this article is supported by Centre for Advances in Reliability and Safety (CAiRS) admitted under AIR@InnoHK Research Cluster. The authors would like to apologise for any inconvenience caused.

AB - The authors regret not including the following acknowledgement in the published version of the above-mentioned article Acknowledgement The work presented in this article is supported by Centre for Advances in Reliability and Safety (CAiRS) admitted under AIR@InnoHK Research Cluster. The authors would like to apologise for any inconvenience caused.

UR - https://www.scopus.com/pages/publications/85189674699

U2 - 10.1016/j.rineng.2024.102045

DO - 10.1016/j.rineng.2024.102045

M3 - Comment/debate/erratum

AN - SCOPUS:85189674699

SN - 2590-1230

JO - Results in Engineering

JF - Results in Engineering

M1 - 102045

ER -

Corrigendum to “Improving PCB defect detection using selective feature attention and pixel shuffle pyramid” [Results. Eng. 21 (2024) 101992] (Results in Engineering (2024) 21, (S2590123024002457), (10.1016/j.rineng.2024.101992))

Abstract

ASJC Scopus subject areas

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