Controllable fabrication of bent near-field optical fiber probes by electric arc heating

H.-N. Lin; U. Lewlomphaisarl; S.H. Chen; L.J. Lee; Din-ping Tsai

doi:10.1063/1.1149188

Controllable fabrication of bent near-field optical fiber probes by electric arc heating

H.-N. Lin, U. Lewlomphaisarl, S.H. Chen, L.J. Lee, Din-ping Tsai

Research output: Journal article publication › Journal article › Academic research › peer-review

12 Citations (Scopus)

Abstract

We describe the construction of a high voltage electric arc puller for controllable fabrication of bent near-field optical fiber probes. Various probes with bent angles ranging from 30° to 75° and bent lengths between 600 and 900 ?m were successfully produced. The tip diameters achieved are between 100 and 200 nm. These bent type probes can be made into cantilevered probes that can be used for any dynamic mode atomic force microscope, and make the construction of a scanning near-field optical microscope easily attainable. © 1998 American Institute of Physics.

Original language	English
Pages (from-to)	3843-3845
Number of pages	3
Journal	Review of Scientific Instruments
Volume	69
Issue number	11
DOIs	https://doi.org/10.1063/1.1149188
Publication status	Published - 1 Jan 1998
Externally published	Yes

ASJC Scopus subject areas

Instrumentation

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10.1063/1.1149188

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abstract = "We describe the construction of a high voltage electric arc puller for controllable fabrication of bent near-field optical fiber probes. Various probes with bent angles ranging from 30° to 75° and bent lengths between 600 and 900 ?m were successfully produced. The tip diameters achieved are between 100 and 200 nm. These bent type probes can be made into cantilevered probes that can be used for any dynamic mode atomic force microscope, and make the construction of a scanning near-field optical microscope easily attainable. {\textcopyright} 1998 American Institute of Physics.",

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AU - Tsai, Din-ping

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N2 - We describe the construction of a high voltage electric arc puller for controllable fabrication of bent near-field optical fiber probes. Various probes with bent angles ranging from 30° to 75° and bent lengths between 600 and 900 ?m were successfully produced. The tip diameters achieved are between 100 and 200 nm. These bent type probes can be made into cantilevered probes that can be used for any dynamic mode atomic force microscope, and make the construction of a scanning near-field optical microscope easily attainable. © 1998 American Institute of Physics.

AB - We describe the construction of a high voltage electric arc puller for controllable fabrication of bent near-field optical fiber probes. Various probes with bent angles ranging from 30° to 75° and bent lengths between 600 and 900 ?m were successfully produced. The tip diameters achieved are between 100 and 200 nm. These bent type probes can be made into cantilevered probes that can be used for any dynamic mode atomic force microscope, and make the construction of a scanning near-field optical microscope easily attainable. © 1998 American Institute of Physics.

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Controllable fabrication of bent near-field optical fiber probes by electric arc heating

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