Construction of a dual mode scanning near-field optical microscope based on a tapping mode atomic force microscope

H.-N. Lin, S.H. Chen, L.J. Lee, Din-ping Tsai

Research output: Journal article publicationJournal articleAcademic researchpeer-review

3 Citations (Scopus)


We present the modification of a commercial tapping mode atomic force microscope into a reflection and transmission dual mode scanning near-field optical microscope. In the configuration, the normal force detection unit is replaced by a shear force detection module and an interfacing circuit. The tip-sample distance control is therefore similar to tapping mode operation. Detection of the near-field signals is based on photodiodes and the lock-in technique, and the resolutions obtained for the topography and the near-field signal are around 80 and 150 nm, respectively. © 1998 American Institute of Physics.
Original languageEnglish
Pages (from-to)3840-3842
Number of pages3
JournalReview of Scientific Instruments
Issue number11
Publication statusPublished - 1 Jan 1998
Externally publishedYes

ASJC Scopus subject areas

  • Instrumentation

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