Abstract
Recently, there has been great interest in physico-chemical surface treatments for modifying polymer surfaces. Utraviolet (UV)-excimer-laser irradiation of polymers is of particular interest. In this study, polyamide was irradiated by a 193 nm excimer with a fluence above its ablation threshold (high-fluence). Morphological changes of the resulting samples were characterized by scanning electron microscopy (SEM) and tapping mode atomic force microscopy (TM-AFM). Chemical modifications by laser treatment were studied by X-ray photoelectron spectroscopy (XPS), time-of-flight secondary ion mass spectrometry (ToF-SIMS) and chemical force microscopy (CFM). Topographical results indicated that 'ripple-like' structures of micrometer size were formed after laser irradiation. XPS and Tof-SIMS results showed that bond scission occurred on the polymer surface under the action of high-fluence. Changes in surface chemical properties of the laser-irradiated polyamide were supported by CFM experiments.
| Original language | English |
|---|---|
| Pages (from-to) | 627-633 |
| Number of pages | 7 |
| Journal | Polymer International |
| Volume | 53 |
| Issue number | 6 |
| DOIs | |
| Publication status | Published - 1 Jun 2004 |
Keywords
- Physico-chemical surface treatments
- Polyamide
- UV excimer laser
ASJC Scopus subject areas
- Polymers and Plastics
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