Coded Diffraction Pattern Phase Retrieval with Green Noise Masks

Qiuliang Ye; Chris Y.H. Chan; Michael G. Somekh; Daniel P.K. Lun

doi:10.1117/12.2626221

Coded Diffraction Pattern Phase Retrieval with Green Noise Masks

Qiuliang Ye, Chris Y.H. Chan, Michael G. Somekh, Daniel P.K. Lun

The Hong Kong Polytechnic University

Research output: Chapter in book / Conference proceeding › Conference article published in proceeding or book › Academic research › peer-review

Abstract

Coded-diffraction-pattern phase retrieval algorithms enhance performance with the help of random masks. However, traditional methods only focus on the randomness of the masks and disregard their non-bandlimited characteristics. The intensity measurements thus include plenty of high-frequency components outside the consideration of phase retrieval algorithm and lead to degraded performance. This article presents a green noise binary masking technique to substantially reduce the high-frequency components of the masks while meeting the randomization criterion. In addition, a novel phase retrieval algorithm is proposed to incorporate arbitrary denoising algorithms as prior based on the plug-and-plug framework. Simulation and experimental results show that the proposed green noise-masking technique and the plug-and-play reconstruction algorithm outperform the traditional methods in phase retrieval.

Original language	English
Title of host publication	International Workshop on Advanced Imaging Technology, IWAIT 2022
Editors	Masayuki Nakajima, Shogo Muramatsu, Jae-Gon Kim, Jing-Ming Guo, Qian Kemao
Publisher	SPIE
Pages	1-6
Number of pages	6
Volume	12177
ISBN (Electronic)	9781510653313
DOIs	https://doi.org/10.1117/12.2626221
Publication status	Published - 30 Apr 2022
Event	2022 International Workshop on Advanced Imaging Technology, IWAIT 2022 - Hong Kong, China Duration: 4 Jan 2022 → 6 Jan 2022

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	12177
ISSN (Print)	0277-786X
ISSN (Electronic)	1996-756X

Conference

Conference	2022 International Workshop on Advanced Imaging Technology, IWAIT 2022
Country/Territory	China
City	Hong Kong
Period	4/01/22 → 6/01/22

Keywords

coded-diffraction-pattern
green noise
Phase retrieval
plug-and-play optimization

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

More information

10.1117/12.2626221

Cite this

Ye, Q., Chan, C. Y. H., Somekh, M. G., & Lun, D. P. K. (2022). Coded Diffraction Pattern Phase Retrieval with Green Noise Masks. In M. Nakajima, S. Muramatsu, J.-G. Kim, J.-M. Guo, & Q. Kemao (Eds.), International Workshop on Advanced Imaging Technology, IWAIT 2022 (Vol. 12177, pp. 1-6). Article 121770V (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 12177). SPIE. https://doi.org/10.1117/12.2626221

Ye, Qiuliang ; Chan, Chris Y.H. ; Somekh, Michael G. et al. / Coded Diffraction Pattern Phase Retrieval with Green Noise Masks. International Workshop on Advanced Imaging Technology, IWAIT 2022. editor / Masayuki Nakajima ; Shogo Muramatsu ; Jae-Gon Kim ; Jing-Ming Guo ; Qian Kemao. Vol. 12177 SPIE, 2022. pp. 1-6 (Proceedings of SPIE - The International Society for Optical Engineering).

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abstract = "Coded-diffraction-pattern phase retrieval algorithms enhance performance with the help of random masks. However, traditional methods only focus on the randomness of the masks and disregard their non-bandlimited characteristics. The intensity measurements thus include plenty of high-frequency components outside the consideration of phase retrieval algorithm and lead to degraded performance. This article presents a green noise binary masking technique to substantially reduce the high-frequency components of the masks while meeting the randomization criterion. In addition, a novel phase retrieval algorithm is proposed to incorporate arbitrary denoising algorithms as prior based on the plug-and-plug framework. Simulation and experimental results show that the proposed green noise-masking technique and the plug-and-play reconstruction algorithm outperform the traditional methods in phase retrieval.",

keywords = "coded-diffraction-pattern, green noise, Phase retrieval, plug-and-play optimization",

author = "Qiuliang Ye and Chan, {Chris Y.H.} and Somekh, {Michael G.} and Lun, {Daniel P.K.}",

note = "Funding Information: * The work described in this paper was supported by a grant from the Research Grants Council of the Hong Kong Special Administrative Region, China (Project No. PolyU152478/16E) and the Sichuan Science and Technology Program (No. 2020YFH0122). *(Corresponding author: Dr Daniel P.K. Lun, e-mail: [email protected]). Publisher Copyright: {\textcopyright} 2022 SPIE.; 2022 International Workshop on Advanced Imaging Technology, IWAIT 2022 ; Conference date: 04-01-2022 Through 06-01-2022",

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Ye, Q, Chan, CYH, Somekh, MG & Lun, DPK 2022, Coded Diffraction Pattern Phase Retrieval with Green Noise Masks. in M Nakajima, S Muramatsu, J-G Kim, J-M Guo & Q Kemao (eds), International Workshop on Advanced Imaging Technology, IWAIT 2022. vol. 12177, 121770V, Proceedings of SPIE - The International Society for Optical Engineering, vol. 12177, SPIE, pp. 1-6, 2022 International Workshop on Advanced Imaging Technology, IWAIT 2022, Hong Kong, China, 4/01/22. https://doi.org/10.1117/12.2626221

Coded Diffraction Pattern Phase Retrieval with Green Noise Masks. / Ye, Qiuliang; Chan, Chris Y.H.; Somekh, Michael G. et al.
International Workshop on Advanced Imaging Technology, IWAIT 2022. ed. / Masayuki Nakajima; Shogo Muramatsu; Jae-Gon Kim; Jing-Ming Guo; Qian Kemao. Vol. 12177 SPIE, 2022. p. 1-6 121770V (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 12177).

Research output: Chapter in book / Conference proceeding › Conference article published in proceeding or book › Academic research › peer-review

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N1 - Funding Information: * The work described in this paper was supported by a grant from the Research Grants Council of the Hong Kong Special Administrative Region, China (Project No. PolyU152478/16E) and the Sichuan Science and Technology Program (No. 2020YFH0122). *(Corresponding author: Dr Daniel P.K. Lun, e-mail: [email protected]). Publisher Copyright: © 2022 SPIE.

PY - 2022/4/30

Y1 - 2022/4/30

N2 - Coded-diffraction-pattern phase retrieval algorithms enhance performance with the help of random masks. However, traditional methods only focus on the randomness of the masks and disregard their non-bandlimited characteristics. The intensity measurements thus include plenty of high-frequency components outside the consideration of phase retrieval algorithm and lead to degraded performance. This article presents a green noise binary masking technique to substantially reduce the high-frequency components of the masks while meeting the randomization criterion. In addition, a novel phase retrieval algorithm is proposed to incorporate arbitrary denoising algorithms as prior based on the plug-and-plug framework. Simulation and experimental results show that the proposed green noise-masking technique and the plug-and-play reconstruction algorithm outperform the traditional methods in phase retrieval.

AB - Coded-diffraction-pattern phase retrieval algorithms enhance performance with the help of random masks. However, traditional methods only focus on the randomness of the masks and disregard their non-bandlimited characteristics. The intensity measurements thus include plenty of high-frequency components outside the consideration of phase retrieval algorithm and lead to degraded performance. This article presents a green noise binary masking technique to substantially reduce the high-frequency components of the masks while meeting the randomization criterion. In addition, a novel phase retrieval algorithm is proposed to incorporate arbitrary denoising algorithms as prior based on the plug-and-plug framework. Simulation and experimental results show that the proposed green noise-masking technique and the plug-and-play reconstruction algorithm outperform the traditional methods in phase retrieval.

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Y2 - 4 January 2022 through 6 January 2022

ER -

Ye Q, Chan CYH, Somekh MG, Lun DPK. Coded Diffraction Pattern Phase Retrieval with Green Noise Masks. In Nakajima M, Muramatsu S, Kim JG, Guo JM, Kemao Q, editors, International Workshop on Advanced Imaging Technology, IWAIT 2022. Vol. 12177. SPIE. 2022. p. 1-6. 121770V. (Proceedings of SPIE - The International Society for Optical Engineering). doi: 10.1117/12.2626221

Coded Diffraction Pattern Phase Retrieval with Green Noise Masks

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