Coded Diffraction Pattern Phase Retrieval with Green Noise Masks

Qiuliang Ye, Chris Y.H. Chan, Michael G. Somekh, Daniel P.K. Lun

Research output: Chapter in book / Conference proceedingConference article published in proceeding or bookAcademic researchpeer-review


Coded-diffraction-pattern phase retrieval algorithms enhance performance with the help of random masks. However, traditional methods only focus on the randomness of the masks and disregard their non-bandlimited characteristics. The intensity measurements thus include plenty of high-frequency components outside the consideration of phase retrieval algorithm and lead to degraded performance. This article presents a green noise binary masking technique to substantially reduce the high-frequency components of the masks while meeting the randomization criterion. In addition, a novel phase retrieval algorithm is proposed to incorporate arbitrary denoising algorithms as prior based on the plug-and-plug framework. Simulation and experimental results show that the proposed green noise-masking technique and the plug-and-play reconstruction algorithm outperform the traditional methods in phase retrieval.

Original languageEnglish
Title of host publicationInternational Workshop on Advanced Imaging Technology, IWAIT 2022
EditorsMasayuki Nakajima, Shogo Muramatsu, Jae-Gon Kim, Jing-Ming Guo, Qian Kemao
Number of pages6
ISBN (Electronic)9781510653313
Publication statusPublished - 30 Apr 2022
Event2022 International Workshop on Advanced Imaging Technology, IWAIT 2022 - Hong Kong, China
Duration: 4 Jan 20226 Jan 2022

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X


Conference2022 International Workshop on Advanced Imaging Technology, IWAIT 2022
CityHong Kong


  • coded-diffraction-pattern
  • green noise
  • Phase retrieval
  • plug-and-play optimization

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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