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CMOS compatible MEMS pyroelectric infrared detectors: From AlN to ScAlN

  • Doris K.T. Ng
  • , Chong Pei Ho
  • , Tantan Zhang
  • , Linfang Xu
  • , Li Yan Siow
  • , Wing Wai Chung
  • , Hong Cai
  • , Lennon Y.T. Lee
  • , Qingxin Zhang
  • , Navab Singh

Research output: Chapter in book / Conference proceedingConference article published in proceeding or bookAcademic researchpeer-review

Abstract

We present the optical and electrical properties of AlN-based and 12% doped ScAlN-based pyroelectric detectors fabricated on 8-inch wafers respectively. Both AlN and ScAlN materials are deposited at a temperature of ∼200oC, making them potential candidates for CMOS compatible MEMS pyroelectric detectors. FTIR spectroscopy is used to measure the absorption of these pyroelectric detectors over the wavelength range of ∼2-14 μm and the results show absorption improvement up to ∼75% for ScAlN-based pyroelectric detectors compared to that of AlN-based pyroelectric detectors at the wavelength of 4.26 μm where CO gas absorption of IR radiation is anticipated. Higher output current (∼3-fold increase) is also observed from ScAlN-based pyroelectric detectors. Other than pyroelectric coefficient that contributes to improved performance for ScAlN-based pyroelectric detectors, we believe that absorptivity of the device also plays a major role in the performance of pyroelectric IR detectors. The results obtained from the study of the electrical and optical properties of AlN-based and ScAlN-based CMOS compatible MEMS pyroelectric detectors will bring forth potential applications of these detectors onto multi-functional integrable and monolithic platforms.

Original languageEnglish
Title of host publicationMOEMS and Miniaturized Systems XX
EditorsHans Zappe, Wibool Piyawattanametha, Yong-Hwa Park
PublisherSPIE
ISBN (Electronic)9781510642294
DOIs
Publication statusPublished - Mar 2021
Externally publishedYes
EventMOEMS and Miniaturized Systems XX 2021 - Virtual, Online, United States
Duration: 6 Mar 202111 Mar 2021

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume11697
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceMOEMS and Miniaturized Systems XX 2021
Country/TerritoryUnited States
CityVirtual, Online
Period6/03/2111/03/21

Keywords

  • aluminum nitride
  • CMOS compatible
  • infrared
  • MEMS
  • pyroelectric detector
  • scandium aluminum nitride

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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