Chemical force microscopic study of UV excimer laser irradiated polyamide

Yiu Wan Yip, Kwong Chan, Kwan Moon Sin, Kai Shui Lau

Research output: Journal article publicationConference articleAcademic researchpeer-review

Abstract

Chemical force microscopic (CFM) study of ultraviolet excimer laser irradiated polyamide was presented. The ability of CFM was used to image and discriminate the areas exposing different functional groups on polymers. CFM results showed that high-fluence laser treated polyamide has the highest adhesive force with the modified tip in a water medium when compared with the control and low-fluence ones.
Original languageEnglish
Pages (from-to)381-386
Number of pages6
JournalMaterials Research Society Symposium - Proceedings
Volume738
Publication statusPublished - 30 Jun 2003
EventSpatially Resolved Characterization of Local Phenomena in Materials and Nanostructures - Boston, MA, United States
Duration: 2 Dec 20026 Dec 2002

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

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