Characterization of ultra-precision freeform surfaces using an intrinsic feature-based pattern analysis

Wing Bun Lee; F. C. Cheung; L. B. Kong; Suet To

Characterization of ultra-precision freeform surfaces using an intrinsic feature-based pattern analysis

Wing Bun Lee, F. C. Cheung, L. B. Kong, Suet To

Research output: Chapter in book / Conference proceeding › Conference article published in proceeding or book › Academic research › peer-review

Abstract

This paper presents a framework of a Surface Intrinsic Feature Based Method (SIFBM) and hence a SIF-based freeform surface characterization system is established, which attempts to address the deficiency and limitations of the traditional freeform surface characterization methods which are more susceptible to the present outliers and uncertainty due to the geometry complexity of the freeform surfaces. SIFBM is a generalized methodology which is independent of the types of freeform surfaces being characterized, and also free of the surface embedded frame. A prototype surface characterization system has been built based on the SIFBM and its capability has been successfully realized through a preliminary experiment.

Original language	English
Title of host publication	Proceedings of the 10th Anniversary International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2008
Publisher	euspen
Pages	277-281
Number of pages	5
Volume	2
ISBN (Electronic)	9780955308253
Publication status	Published - 1 Jan 2008
Event	10th Anniversary International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2008 - Zurich, Switzerland Duration: 18 May 2008 → 22 May 2008

Conference

Conference	10th Anniversary International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2008
Country/Territory	Switzerland
City	Zurich
Period	18/05/08 → 22/05/08

Keywords

Image Processing
Pattern Analysis
Surface characterization
Surface Intrinc Feature
Ultra-precision Freeform surfaces

ASJC Scopus subject areas

Instrumentation
Mechanical Engineering
General Materials Science
Environmental Engineering
Industrial and Manufacturing Engineering

Cite this

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title = "Characterization of ultra-precision freeform surfaces using an intrinsic feature-based pattern analysis",

abstract = "This paper presents a framework of a Surface Intrinsic Feature Based Method (SIFBM) and hence a SIF-based freeform surface characterization system is established, which attempts to address the deficiency and limitations of the traditional freeform surface characterization methods which are more susceptible to the present outliers and uncertainty due to the geometry complexity of the freeform surfaces. SIFBM is a generalized methodology which is independent of the types of freeform surfaces being characterized, and also free of the surface embedded frame. A prototype surface characterization system has been built based on the SIFBM and its capability has been successfully realized through a preliminary experiment.",

keywords = "Image Processing, Pattern Analysis, Surface characterization, Surface Intrinc Feature, Ultra-precision Freeform surfaces",

author = "Lee, {Wing Bun} and Cheung, {F. C.} and Kong, {L. B.} and Suet To",

year = "2008",

month = jan,

day = "1",

language = "English",

volume = "2",

pages = "277--281",

booktitle = "Proceedings of the 10th Anniversary International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2008",

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note = "10th Anniversary International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2008 ; Conference date: 18-05-2008 Through 22-05-2008",

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Lee, WB, Cheung, FC, Kong, LB & To, S 2008, Characterization of ultra-precision freeform surfaces using an intrinsic feature-based pattern analysis. in Proceedings of the 10th Anniversary International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2008. vol. 2, euspen, pp. 277-281, 10th Anniversary International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2008, Zurich, Switzerland, 18/05/08.

Characterization of ultra-precision freeform surfaces using an intrinsic feature-based pattern analysis. / Lee, Wing Bun; Cheung, F. C.; Kong, L. B. et al.
Proceedings of the 10th Anniversary International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2008. Vol. 2 euspen, 2008. p. 277-281.

Research output: Chapter in book / Conference proceeding › Conference article published in proceeding or book › Academic research › peer-review

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AU - Lee, Wing Bun

AU - Cheung, F. C.

AU - Kong, L. B.

AU - To, Suet

PY - 2008/1/1

Y1 - 2008/1/1

N2 - This paper presents a framework of a Surface Intrinsic Feature Based Method (SIFBM) and hence a SIF-based freeform surface characterization system is established, which attempts to address the deficiency and limitations of the traditional freeform surface characterization methods which are more susceptible to the present outliers and uncertainty due to the geometry complexity of the freeform surfaces. SIFBM is a generalized methodology which is independent of the types of freeform surfaces being characterized, and also free of the surface embedded frame. A prototype surface characterization system has been built based on the SIFBM and its capability has been successfully realized through a preliminary experiment.

AB - This paper presents a framework of a Surface Intrinsic Feature Based Method (SIFBM) and hence a SIF-based freeform surface characterization system is established, which attempts to address the deficiency and limitations of the traditional freeform surface characterization methods which are more susceptible to the present outliers and uncertainty due to the geometry complexity of the freeform surfaces. SIFBM is a generalized methodology which is independent of the types of freeform surfaces being characterized, and also free of the surface embedded frame. A prototype surface characterization system has been built based on the SIFBM and its capability has been successfully realized through a preliminary experiment.

KW - Image Processing

KW - Pattern Analysis

KW - Surface characterization

KW - Surface Intrinc Feature

KW - Ultra-precision Freeform surfaces

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M3 - Conference article published in proceeding or book

VL - 2

SP - 277

EP - 281

BT - Proceedings of the 10th Anniversary International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2008

PB - euspen

T2 - 10th Anniversary International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2008

Y2 - 18 May 2008 through 22 May 2008

ER -

Characterization of ultra-precision freeform surfaces using an intrinsic feature-based pattern analysis

Abstract

Conference

Keywords

ASJC Scopus subject areas

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