Characterization of Soil Texture by Dielectric Properties using Ground Penetrating Radars operating at Different Frequencies of Cyclic Variation of Moisture Content of Soils

Wai Lok Lai; W. F.S. Tsang

Characterization of Soil Texture by Dielectric Properties using Ground Penetrating Radars operating at Different Frequencies of Cyclic Variation of Moisture Content of Soils

Wai Lok Lai
, W. F.S. Tsang

Department of Land Surveying and Geo-Informatics

Research output: Chapter in book / Conference proceeding › Conference article published in proceeding or book › Academic research › peer-review

Original language	English
Title of host publication	SEG International Exposition and 75th Annual Meeting 2005
Place of Publication	Houston
Publisher	Society of Exploration Geophysicists
Pages	1192-1195
Volume	6
Publication status	Published - 2005
Event	SEG International Exposition and 75th Annual Meeting 2005 - Houston, United States Duration: 6 Nov 2005 → 11 Nov 2005

Conference

Conference	SEG International Exposition and 75th Annual Meeting 2005
Country/Territory	United States
City	Houston
Period	6/11/05 → 11/11/05

Cite this

@inproceedings{6e178b31c974451798c7826043f78fc6,

title = "Characterization of Soil Texture by Dielectric Properties using Ground Penetrating Radars operating at Different Frequencies of Cyclic Variation of Moisture Content of Soils",

author = "Lai, \{Wai Lok\} and Tsang, \{W. F.S.\}",

year = "2005",

language = "English",

volume = "6",

pages = "1192--1195",

booktitle = "SEG International Exposition and 75th Annual Meeting 2005",

publisher = "Society of Exploration Geophysicists",

address = "United States",

note = "SEG International Exposition<br/>and 75th Annual Meeting<br/>2005 ; Conference date: 06-11-2005 Through 11-11-2005",

}

Lai, WL & Tsang, WFS 2005, Characterization of Soil Texture by Dielectric Properties using Ground Penetrating Radars operating at Different Frequencies of Cyclic Variation of Moisture Content of Soils. in SEG International Exposition and 75th Annual Meeting 2005. vol. 6, Society of Exploration Geophysicists, Houston, pp. 1192-1195, SEG International Exposition
and 75th Annual Meeting
2005, Houston, Texas, United States, 6/11/05.

Characterization of Soil Texture by Dielectric Properties using Ground Penetrating Radars operating at Different Frequencies of Cyclic Variation of Moisture Content of Soils. / Lai, Wai Lok; Tsang, W. F.S.
SEG International Exposition and 75th Annual Meeting 2005. Vol. 6 Houston: Society of Exploration Geophysicists, 2005. p. 1192-1195.

Research output: Chapter in book / Conference proceeding › Conference article published in proceeding or book › Academic research › peer-review

TY - GEN

T1 - Characterization of Soil Texture by Dielectric Properties using Ground Penetrating Radars operating at Different Frequencies of Cyclic Variation of Moisture Content of Soils

AU - Lai, Wai Lok

AU - Tsang, W. F.S.

PY - 2005

Y1 - 2005

M3 - Conference article published in proceeding or book

VL - 6

SP - 1192

EP - 1195

BT - SEG International Exposition and 75th Annual Meeting 2005

PB - Society of Exploration Geophysicists

CY - Houston

T2 - SEG International Exposition<br/>and 75th Annual Meeting<br/>2005

Y2 - 6 November 2005 through 11 November 2005

ER -