Characterization of nano recorded marks at different writing strategies on phase-change recording layer of optical disks

S.K. Lin, I.C. Lin, Din-ping Tsai

Research output: Journal article publicationJournal articleAcademic researchpeer-review

28 Citations (Scopus)

Abstract

Conductive-atomic force microscopy has been successfully used for characterizing recorded marks on commercial digital versatile disk and Blu-ray disk. Nano recorded marks beyond diffraction limit are imaged with high spatial resolution and excellent contrast of conductivity. The smallest mark size resolved is around 23.5 nm which is limited by background spots around 18.5 nm. The results of different optical power and writing strategy on the size, shape, and close packed writing process of recorded marks clearly show the opto-thermal response of phase-change recording layer. © 2006 Optical Society of America.
Original languageEnglish
Pages (from-to)4452-4458
Number of pages7
JournalOptics Express
Volume14
Issue number10
DOIs
Publication statusPublished - 1 Jan 2006

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

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