Characterization of Ge 2Sb 2Te 5 thin film alloys using conductive-tip atomic force microscopy

C.M. Chang, Y.J. Liu, M.L. Tseng, N.-N. Chu, D.-W. Huang, M. Mansuripur, Din-ping Tsai

Research output: Journal article publicationJournal articleAcademic researchpeer-review

3 Citations (Scopus)

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